Prof. Dr. Alexei Erko, Scientific Director at IAP

Professor Erko received his PhD degree in experimental physics at the Moscow Physical Engineering Institute in 1981 and his habilitation in physics (Doctor of Science) in 1991. He became Professor of Experimental Physics in 1993.
From 1978 to 1994, he was employed at the Institute of Solid State Physics and the Institute of Microelectronics Technology of the Russian Academy of Sciences in Chernogolovka, Moscow district, initially as Senior Scientist and then later as Head of the “X-ray Optics and Technology Laboratory”.
In 1994, he came to Berlin to do research at the storage ring BESSY II, where he worked for the BESSY GmbH Berlin as Senior Scientist from 1994 to 2009, and then from 2009 to 2010 as Senior Scientist for the Helmholtz Centre Berlin for Materials und Energy GmbH (HZB).
In 2010, he became Head of the Institute for Nanometre Optics and Technology.
His research interests focus especially on x-ray optics, x-ray holography and synchrotron radiation beamline design. He is co-author of two monographs and co-editor of two books on x-ray optics and x-ray microscopy.
Professor Erko successfully organized the lecture series for master students on the topic “Modern X-ray and Neutron Methods for Science and Technology” at the Free University Berlin since winter semester 2009/2010.
In 2011, he was appointed Honorary Professor for Experimental Physics by the president of the Freie Universität Berlin.
After his Helmholtz Centre Berlin for Materials and Energy GmbH (HZB) career he joined the IAP as its Scientific Director in March 2018. Also in 2018 the Association of Friends of HZB awarded him with the European Innovation-Award on Synchrotron Radiation.

Personal publication history  1979-2018 (Journal references)

2018
1. Gratings for synchrotron and FEL beamlines: a project for the manufacture of ultra-precise gratings at Helmholtz Zentrum Berlin, F. Siewert, B. Löchel, J. Buchheim, F. Eggenstein, A. Firsov, G. Gwalt, O. Kutz, St. Lemke, B. Nelles, I. Rudolph, F. Schäfers, T. Seliger, F. Senf, A. Sokolov, Ch. Waberski, J. Wolf, T. Zeschke, I. Zizak, R. Follath, T. Arnold, F. Frost, F. Pietag, A. Erko, J. Synchrotron Rad. (2018). 25, 91-99
2.Probing the oxidation state of transition metal complexes: a case study on how charge and spin densities determine Mn L-edge X-ray absorption energies, M. Kubin, M. Guo, T. Kroll, Heike Löchel, E. Källman, M. L. Baker, R. Mitzner, S. Gul, J. Kern, A Föhlisch, A. Erko, U. Bergmann, V. Yachandra, J. Yano, M. Lundberg, P. Wernet, Chemical Science, (2018), 9, 6813-6829
3. X-ray spectroscopy with variable line spacing based on reflection zone plate optics Z. Yin, H. Löchel, J. Rehanek, C. Goy, A. Kalinin, A. Schottelius, F. Trinter, P. Miedema, A. Jain, J. Valerio, P. Busse, F. Lehmkühler, J. Möller, G. Grübel, A. Madsen, J. Viefhaus, R. E. Grisenti, M. Beye, A. Erko, S. Techert, Optics Letters (2018), 43, 18, 4390-4393

2017
4. Polycapillary-boosted instrument performance in the extreme ultraviolet regime for inverse photoemission spectroscopy, C. Braig, A. Sokolov, R. G. Wilks, E. Kozina, T. Kunze, S. Bjeoumikhova, M. Thiel, A. Erko, M. Bär, (2017), Optics Express, 25(25), 31840-31852
5. Highly efficient soft X-ray spectrometer based on a reflection zone plate for resonant inelastic X-ray scattering measurement, Z. Yin, J. Rehanek, H. Löchel, C. Braig, J. Buck, A. Firsov, J. Viefhaus, A. Erko, S. Techert, (2017), Optics Express, 25(10), 10984-10996
6. Soft x-ray absorption spectroscopy of metalloproteins and high-valent metal-complexes at room temperature using free-electron lasers, M. Kubin, J. Kern, S. Gul, T. Kroll, R. Chatterjee, H. Löchel, F. D. Fuller, R. G. Sierra, W. Quevedo, C. Weniger, J. Rehanek, A. Firsov, H. Laksmono, C. Weninger, R. Alonso-Mori, D. L. Nordlund, B. Lassalle-Kaiser, J. M. Glownia, J. Krzywinski, S. Moeller, J. J. Turner, M. P. Minitti, G. L. Dakovski, S. Koroidov, A. Kawde, J. S. Kanady, E. Y. Tsui, S. Suseno, Z. Han, E. Hill, T. Taguchi, A. S. Borovik, T. Agapie, J. Messinger, A. Erko, A. Föhlisch, U. Bergmann, R. Mitzner, V. K. Yachandra, J. Yano, P. Wernet, Structural Dynamics (2017), 4, 054307
7. Pulse picker for synchrotron radiation driven by a surface acoustic wave, S. Vadilonga, I. Zizak, D. Roshchupkin, A. Petsiuk, I. Dolbnya, K. Sawhney, A. Erko, Opt. Lett. (2017), 42(10), 1915-1918
8. Observation of sagittal X-ray diffraction by surface acoustic waves in Bragg geometry, S. Vadilonga, I. Zizak, D. Roshchupkin, E. Emelin, A. Petsiuk, W. Leitenberger, A. Erko, J. Appl. Cryst. (2017), 50, 525–530
9. Reflection zone plate concept for resonant inelastic x-ray scattering spectrometry, C. Braig, H. Löchel, J. Rehanek, A. Firsov, M. Brzhezinskaya, A. Erko, Applied Optics, (2017), 56 (3), 515-520
10. Two-dimensional X-ray focusing by off-axis grazing incidence phase Fresnel zone plate on the laboratory X-ray source, M. Grigoriev, R. Fakhrtdinov, D. Irzhak, Al. Firsov, An. Firsov, A. Svintsov, A. Erko, D. Roshchupkin, Optics Communications, (2017), 385, 15-18

2016
11. X-ray absorption spectroscopy using a self-seeded soft X-ray free-electron laser, Th. Kroll, J. Kern, M. Kubin, D. Ratner, S. Gul, F. D. Fuller, H. Löchel, J. Krzywinski, A. Lutman, Y. Ding, G. L. Dakovski, S. Moeller, J. J. Turner, R. Alonso-Mori, D. L. Nordlund, J. Rehanek, C. Weniger, A. Firsov, M. Brzhezinskaya, R. Chatterjee, B. Lassalle-Kaiser, R. G. Sierra, H. Laksmono, E. Hill, A. Borovik, A. Erko, A. Föhlisch, R.Mitzner, V. K. Yachandra, J. Yano, P. Wernet, U. Bergmann, Optics Express, (2016), 24(20), 22469-22480
12. Piezoelectric Ca3NbGa3Si2O14 crystal: crystal growth, piezoelectric and acoustic properties, D. Roshchupkin, L. Ortega, O. Plotitcyna, A. Erko, I. Zizak, S. Vadilonga, D. Irzhak, E. Emelin, O. Buzanov, W. Leitenberger, Applied Physics A (2016) 122:753
13. At-wavelength metrology facility for soft X-ray reflection optics, A. Sokolov, P. Bischoff, F. Eggenstein, A. Erko, A. Gaupp, S. Kuenstner, M. Mast, J.-S. Schmidt, F. Senf, F. Siewert, T. Zeschke, F. Schäfers, Review of Scientific Instruments, (2016), 87(5), 052005
14. Structural investigation of supported Cu-n clusters under vacuum and ambient air conditions using EXAFS spectroscopy, S. Peredkov, S. Peters, M. Al-Hada, A. Erko, M. Neeb, W. Eberhardt, Catalysis Science and Technology, (2016), 6(18), 6942-6952
15. Highly efficient blazed grating with multilayer coating for tender X-ray energies, F. Senf, F. Bijkerk, F. Eggenstein, G. Gwalt, Q. Huang, R. Kruijs, O. Kutz, S. Lemke, Louis, E.; M. Mertin, I. Packe, I. Rudolph, F. Schäfers, F. Siewert, A. Sokolov, J. M. Sturm, Ch. Waberski, Z. Wang, J. Wolf, T. Zeschke, A. Erko, Optics Express (2016) 24(12) 13220-13230
16. Single shot near edge x-ray absorption fine structure spectroscopy in the laboratory, I. Mantouvalou, K. Witte, W. Martyanov, A. Jonas, D. Grötzsch, C. Streeck, H. Löchel, I. Rudolph, A. Erko, H. Stiel, B. Kanngießer Appl. Phys. Lett. 108, (2016) 201106
17. The at-wavelength metrology facility for UV- and XUV-reflection and diffraction optics at BESSY-II, F. Schäfers, P. Bischoff, F. Eggenstein, A. Erko, A. Gaupp, S. Künstner, M. Mast, J.-S. Schmidt, F. Senf, F. Siewert, A. Sokolov and Th. Zeschke, J. Synchrotron Rad. (2016). 23, 67–77
18. Hard x-ray spectroscopy and imaging by a reflection zone plate in the presence of astigmatism, C. Braig, H. Löchel, A. Firsov, M. Brzhezinskaya, A. Hafner, J. Rehanek, M. Wojcik, A. Macrander, L. Assoufid, and A. Erko, Optics Letters , 41(1), (2016), 29-32

2015
19. Reflection zone plate wavelength-dispersive spectrometer for ultra-light elements measurements, A. Hafner, L. Anklamm, A. Firsov, A. Firsov, H. Löchel, A. Sokolov, R. Gubzhokov, A. Erko, Optics Express, 23, (23), (2015), 29476
20. Surface acoustic wave propagation in graphene film, D. Roshchupkin, L. Ortega, I. Zizak, O. Plotitcyna, V. Matveev, O. Kononenko, E. Emelin, A. Erko, K. Tynyshtykbayev, D. Irzhak and Z. Insepov, J. Appl. Phys. 118, 104901 (2015).
21. Femtosecond high-resolution hard X-ray spectroscopy using reflection zone plates, H Löchel, C Braig, M Brzhezinskaya, F Siewert, P Baumgärtel, A Firsov, Optics Express, 23 (7), (2015), 8788-8799

2014
22. Vorteil Multiplex- Spektrometrischer Nachweis von ultraleichten Elementen, A Erko, A Firsov, A. Hafner, R Gubzhokov, A Bjeoumikhov, A Günther, N Langhoff, M. Bretschneider, Y. Höhn, R. Wedell, Laborpraxis, December 2014, 22-24
23. Fabrication of digital rainbow holograms and 3-D imaging using SEM based e-beam lithography, A Firsov, A Firsov, B Löchel, A Erko, A Svintsov, S Zaitsev, Optics express 22 (23), (2014), 28756-28770
24. Device and method for determining the energetic composition of electromagnetic waves, A. Erko, N Langhoff, A Bjeoumikhov US Patent 20,140,314,207
25. FemtoSpeX: a versatile optical pump-soft X-ray probe facility with 100 fs X-ray pulses of variable polarization, K. Holldack, J. Bahrdt, A. Balzer, U. Bovensiepen, M. Brzhezinskaya, A. Erko, A. Eschenlohr, R. Follath, A. Firsov, W. Frentrup, L. Le Guyader, T. Kachel, P. Kuske, R. Mitzner, R. Müller, N. Pontius, T. Quast, I. Radu, J.-S. Schmidt, C. Schüßler-Langeheine, M. Sperling, C. Stamm, C. Trabant and A. Föhlisch, J. Synchrotron Rad. (2014). 21, 1090-1104
26. Methods development for diffraction and spectroscopy studies of metalloenzymes at X-ray free-electron lasers, J Kern, J Hattne, R Tran, R Alonso-Mori, H Laksmono, S Gul, RG Sierra, J. Rehanek, A. Erko, R. Mitzner, Ph. Wernet, U. Bergmann, N. K. Sauter, V. Yachandra, J. Yano, Philosophical Transactions of the Royal Society B: Biological Sciences (2014), 369, 1647, 20130590.
27. New parallel wavelength-dispersive spectrometer based on scanning electron microscope A Erko, A Firsov, R Gubzhokov, A Bjeoumikhov, A Günther, N Langhoff, M. Bretschneider, Y. Höhn, R. Wedell, Optics Express (2014), 22 (14), 16897-16902
28. Design and optimization of a parallel spectrometer for ultra-fast X-ray science, C Braig, H Löchel, R Mitzner, W Quevedo, P Loukas, M Kubin, C Weniger, A. Firsov, J. Rehanek, M. Brzhezinskaya, Ph. Wernet, A. Föhlisch, A. Erko, Optics Express (2014), 22 (10), 12583-12602
29. Monochromatization of femtosecond XUV light pulses with the use of reflection zone plates J Metje, M Borgwardt, A Moguilevski, A Kothe, N Engel, M Wilke, R. Al-Obaidi, D. Tolksdorf, A. Firsov, M. Brzhezinskaya, A. Erko, I. Yu. Kiyan, and Emad F. Aziz Optics Express (2014), 22 (9), 10747-10760
30. Advanced piezoelectric crystal Ca3TaGa3Si2O14 growth, crystal structure perfection, and acoustic properties, D. Roshchupkin, L. Ortega. O. Plotitcyna, ·A. Erko, I. Zizak, D. Irzhak, R. Fahrtdinov, O. Buzanov, Appl Phys A (2014) 114:1105–1112
31. Structural position and charge state of nickel in SrTiO3 I.A Sluchinskaya, A.I Lebedev, A. Erko, Physics of the Solid State (2014), 56 (3), 449-455

2013
32. Correlation between structural and opto-electronic characteristics of crystalline Si microhole arrays for photonic light management, T Sontheimer, V Preidel, D Lockau, F Back, E Rudigier-Voigt, B Löchel, A. Erko, F. Schmidt, A. Schnegg, K. Lips, Ch. Becker, B. Rech. Journal of Applied Physics (2013), 114 (17), 173513
33. Toward sub‐micro‐XRF working at nanometer range using capillary optics, M Dehlinger, C Fauquet, F Jandard, A Bjeoumikhov, S Bjeoumikhova, R Gubzhokov, A Erko, I Zizak, D Pailharey, S Ferrero, B Dahmani, D Tonneau, X‐Ray Spectrometry (2014), 42 (6), 456-461
34. Monochromatizing and focussing femtosecond high-order harmonic radiation with one optical element, M. Ibek, T. Leitner, A. Erko, A. Firsov, and P. Wernet , Rev. Sci. Instrum. (2013), 84, 103102,
35. Competition between CoOx and CoPt phases in Pt/Co/AlOx semi tunnel junctions, H. Garad, L Ortega, A.Y. Ramos, Y Joly, F. Fettar, S. Auffret, B. Rodmacq, Journal of Applied Physics, (2013) 114 (5), 053508
36. Structural position and oxidation state of nickel in SrTiO3 I.A. Sluchinskaya, A.I. Lebedev, A. Erko, Journal of Advanced Dielectrics (2013), 3 (04)
37. L‑Edge X‑ray Absorption Spectroscopy of Dilute Systems Relevant to Metalloproteins Using an X‑ray Free-Electron Laser R. Mitzner, J. Rehanek, J. Kern, S. Gul, J. Hattne, T. Taguchi, R. Alonso-Mori, R. Tran, Ch. Weniger, H. Schröder, W. Quevedo, H. Laksmono, R. G. Sierra, G. Han, B. Lassalle-Kaiser, S. Koroidov, K. Kubicek, S. Schreck, K. Kunnus, M. Brzhezinskaya, A. Firsov, M. P. Minitti, J. J. Turner, S. Moeller, N. K. Sauter, M. J. Bogan, D. Nordlund, W. F. Schlotter, J. Messinger, A. Borovik, S. Techert, F. M. F. de Groot, A. Föhlisch, A. Erko, U. Bergmann, V. K. Yachandra, Ph. Wernet, J. Yano, J. Phys. Chem. Lett. (2013), 4, 3641−3647
38. Structural motifs of pre-nucleation clusters Y. Zhang, I. R. Türkmen, B. Wassermann, A. Erko, and E. Rühl, J. Chem. Phys. (2013), 139, 134506
39. Studying acoustic-wave fields in langasite-family crystals using the BESSY II synchrotron radiation source. D.V. Roshchupkin, O.A. Plotitsyna, R.R. Fakhrtdinov, D.V. Irzhak, A.I. Erko, Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques .(2013), 7 4, 659-662..
40. X-ray diffraction study of surface acoustic waves and pseudo-surface acoustic waves propagation in La3Ga5.5Ta0.5O14 crystal, D. Roshchupkin, L. Ortega, O. Plotitcyna, A. Erko, I. Zizak, D. Irzhak, J. Appl. Phys. 113, (2013), 144909
41. A reflectometer for at-wavelength characterization of gratings, F. Eggenstein, F. Schäfers A. Erko, R. Follath, A. Gaupp, B. Löchel, F. Senf, T. Zeschke Nuclear Instruments and Methods in Physics Research A 710 (2013) 166–171
42. A novel monochromator for experiments with ultrashort X-ray pulses, M. Brzhezinskaya, A. Firsov, K. Holldack, T. Kachel, R. Mitzner, N. Pontius, J.-S. Schmidt, M. Sperling, C. Stamm, A. Föhlisch, A. Erko J. Synchrotron Rad. (2013). 20, 522-530
43. The confocal plane grating spectrometer at BESSY II, R. Könnecke, R. Follath, R. Pontius, N. Schlappa, J. Eggenstein, F. Zeschke, T. Bischoff, P. J.-S. Schmidt, T. Noll, C. Trabant, S. Schreck, Ph. Wernet, S. Eisebitt, F. Senf, C. Schüßler-Langeheine, A. Erko, Föhlisch, A., Journal of Electron Spectroscopy and Related Phenomena, (2013), 188, p.133-139
44. Structural analysis of colloidal MnOx composites, F Polzer, E Holub-Krappe, H Rossner, A Erko, H Kirmse, F Plamper, A. Schmalz, A. Müller, M. Ballauff Colloid and Polymer Science, (2013), 291 (3), 469-481

2012
45. Local structure and site substitution in Al86Ni6Co2Y4.5La1.5 bulk amorphous alloy Y. Liu, G. Schumacher, I. Zizak, A. Erko, J. Banhart, Materials Letters, 70, 1 (2012), 171-173
46. Novel parallel vacuum ultra-violet/X-ray fluorescence spectrometer, A. Erko, A. Firsov, F. Senf, Spectrochimica Acta Part 2012, B 67, 57–63
47. XAFS studies of the local structure and charge state of the Pr impurity in SrTiO3, I. A. Sluchinskaya, A. I. Lebedev, A. Erko, Physics of the Solid State, (2012), 54(5), 975-979.
48. Thermal decomposition and fractal properties of sputter-deposited platinum oxide thin films, A. Mosquera, D.Horwat, L. Vazquez, A. Gutierrez, A. Erko, A. Anders, J. Andersson, J. L. Endrino, Journal of Materials Research, (2012), 27(5), 829-836
49. Feasibility of simultaneous surface topography and XRF mapping using Shear Force Microscopy, M. Dehlinger, C. Dorczynski, C. Fauquet, F. Jandard, D. Tonneau, A. Bjeoumikhov, S. Bjeoumikhova, R. Gubzhokov, A. Erko, I. Zizak, D. Pailharey, S. Ferrero, B. Dahmani, International Journal of Nanotechnology, (2012), 9(3-7), 460-470

2011
50. Thermal decomposition and fractal properties of sputter-deposited platinum oxide thin films A. Mosquera, D. Horwat, L. Vazquez, A. Gutiérrez, A. Erko, A. Anders, J. Andersson, J.L. Endrino. J. Mater. Res., 27, No. 5, (2012), 829-836
51. Combining scanning probe microscopy and X-ray spectroscopy, C. Fauquet, M. Dehlinger, F. Jandard, S. Ferrero, D. Pailharey, S. Larcheri, R. Graziola, J. Purans, A. Bjeoumikhov, A. Erko, I. Zizak, B. Dahmani, D. Tonneau, Nanoscale Research Letters, 6, 308, 2011.
52. Investigation of the thermal diffusion during the formation of a quasicrystalline phase in thin Al-Pd-Re films, A. Y. Seregin, I. A. Makhotkin, S. N. Yakunin, A. I. Erko, E. Y. Tereshchenko, D. S.Shaitura, E. A. Chikina, M. B.Tsetlin, M. N.Mikheeva, E. D. Ol’shanskii, Crystallography Reports, 2011, 56(3), 497-501

2010
53. Application of Conventional and Microbeam Synchrotron Radiation X-Ray Fluorescence and Absorption for the Characterization of Human Nails, M. Katsikini, A. Mavromati, F. Pinakidou, E. C. Paloura, D. Gioulekas, D. Ioannides, A. Erko, I. Zizak, Journal of Nanoscience and Nanotechnology, 10, 2010, 6266–6275
54. Linearly graded GeSi beam-expanding/compressing X-ray monochromator, D. Koryt´ar, C. Ferrari, P. Mikulık, P. Vagovic, E. Dobrocka, V. Ac, P. Konopka, A. Erko and N. Abrosimov, Journal of Applied Crystallography (2010). 43, 176–178

2009
55. Review Article Hard X-ray Micro-spectroscopy at Berliner Elektronenspeicherring für Synchrotronstrahlung II, A. Erko, I. Zizak, Spectrochimica Acta, Part B, 64, (2009) 833–848
56. Origin of the reduced exchange bias in an epitaxial FeNi(111)/CoO(111) bilayer, F. Radu, S. K. Mishra, I. Zizak, A. I. Erko, H. A. Dürr, and W. Eberhardt G. Nowak, S. Buschhorn, H. Zabel, K. Zhernenkov, M. Wolff, D. Schmitz, E. Schierle, E. Dudzik, R. Feyerherm, Phys. Rev. B 79, 184425 (2009)
57. X-ray standing wave studies of metal ions incorporation in Langmuir-Blodgett films N.N. Novikova, S. I. Zheludeva, N. D. Stepina, A. L. Tolstikhina, R. V. Gainutdinov, W. Haase, A. I. Erko, A.A. Knyasev, Yu. G. Galyametdinov, Applied Physics A 94, (2009), 461-466, DOI 10.1007/s00339-008-4971-7
58. X-ray diffraction analysis of the surface acoustic wave propagation in Langatate crystal”, D.V. Roshchupkin, A I Erko, L Ortega, D V Irzhak, Appl. Phys. A (2009) 94: 477–484, DOI 10.1007/s00339-008-4932-1
59. Synchrotron microscopy and spectroscopy for analysis of crystal defects in silicon, W. Seifert, O. F. Vyvenko, T. Arguirov, A. Erko, M. Kittler, C. Rudolf, M. Salome, M. Trushin, I. Zizak, Phys. Status Solidi C 6, No. 3, 765– 771 (2009) / DOI 10.1002/pssc. 200880717
60. Direct evidence for off-centering of Mn impurity in SrTiO3, A. I. Lebedev, I. A. Sluchinskaya, A. Erko, V. F. Kozlovskii, Jetp Letters, (2009), 89/9, 457-460.
61. XAFS studies of the local environment of Pb impurity atoms in barium, strontium, and calcium titanates, A. I. Lebedev, I. A. Sluchinskaya, A. Erko, A. A. Veligzhanin, A. A. Chernyshov, Physics of the Solid State, (2009), 51/5, 991-997
62. Nanoresolution interface studies in thin films by synchrotron x-ray diffraction and by using x-ray waveguide structure, Z. Erdelyi, C. Cserhati, A. Csik, L. Daroczi, G. A. Langer, Z. Balogh, M. Varga, D. L. Beke, I. Zizak and A. Erko, X-Ray Spectrometry, 38, (2009), 338–342
63. Combined XBIC/μ-XRF/μ-XAS/DLTS, investigation of chemical character and electrical properties of Cu and Ni precipitates in silicon, M. Trushin, O. Vyvenko, W. Seifert, M. Kittler, I. Zizak, A. Erko, M. Seibt, C. Rudolf, Phys. Status Solidi C 6, No. 8, (2009), 1868– 1873

2008
64. Capillary μFocus X-ray lenses with parabolic and elliptic profile, A. Bjeoumikhov, M. Erko, S. Bjeoumikhovab, A. Erko,_, I. Snigireva, A. Snigirev, T. Wolff, I. Mantouvalou, W. Malzer, B. Kanngießer, Nuclear Instruments and Methods in Physics Research A587, (2008), 458–463
65. Depth resolved structural study of heavy ion induced phase formation in Si/Fe/Si trilayer, P. Rajput, A. Gupta, C. Meneghini, D. K. Avasthi, N. Darowski, I. Zizak, A. Erko, Hyperfine Interact (2008) 185:9–15 DOI 10.1007/s10751-008-9804-8
66. Transmissive x-ray beam position monitors with submicron position- and submillisecond time resolution, M. R. Fuchs, K. Holldack, M. Bullough, S. Walsh, C. Wilburn, A. Erko, F. Schäfers, U. Mueller, Review of Scientific Instruments, (2008), 79, 063103_2008_ doi:10.1063/1.2938400

2007
67. Sabmicromter hard X-Ray focusing using a single-bounce ellipsoidal capillary combined with a Fresnel zone plate, A. Snigirev, A. Bejeoumikhov, A. Erko, I. Snigireva, M. Grigoriev, M. Erko, S. Bejeoumikhova, Journal of Synchrotron Radiation, (2007), 14, 227-228
68. A new experimental station for simultaneous X-ray microbeam scanning for small- and wide-angle scattering and fluorescence at BESSY II, O. Paris, Chenghao Li, S. Siegel, G. Weseloh, F. Emmerling, H. Riesemeier, A. Erko P. Fratzl, J. Applied Crystallography, (2007). 40, 466–470
69. Two-step hard X-ray focusing combining Fresnel zone plate and single-bounce ellipsoidal capillary, A. Snigirev, A. Bjeoumikhov, A. Erko, I. Snigireva, M. Grigoriev, V. Yunkin, M. Erko, S. Bjeoumikhova J. Synchrotron Rad. (2007). 14, 326–330
70. On the local coordination of Fe in Fe2O3-glass and Fe2O3-glass ceramic systems containing Pb, Na and Si. F. Pinakidou, M. Katsikini, E.C. Paloura, O. Kalogirou, A. Erko, Journal of Non-Crystalline Solids, 353, (2007), 2717–2733
71. X-ray Measurements with Micro and Nano-Resolution at BESSY, A. Gupta, N. Darowsky, I. Zizak, C. Meneghini, G. Schumaher, A. Erko, Spectrochimica Acta, Part B, 62, (2007), 622-625
72. High Resolution Diffraction X-ray Optics, A. Erko, A. Firsov, Optics and Precision Engineering, 15, No12, (2007), 1816-1822
73. On the distribution and bonding enviromrnt of Zn and Fe in Glasses contaning electric furnace dust: a μ-XAFS and μ-XRF, F. Pinakidou, M. Katsikini, E. C. Paloura, P. Kavouras, Th. Kehagias, Ph. Komninou, Th. Karakostas, A. Erko, Journal of Hazardous Materials, 142 (2007) 297–304

2006
74. Arrangement of trace metal contaminations in thin films of liquid crystals studied by X-ray standing wave technique, N.N. Novikova, S.I. Zheludeva, N.D. Stepina, W. Haase, A.I. Erko, A.A. Knyazev, Yu.G. Galyametdinov, Spectrochimica Acta Part B 61 (2006) 1229–1235
75. Structural Localization of Trace Amounts of Impurity Ionsin Langmuir–Blodgett Films by the X-ray Standing Wave Method, N. N. Novikova, S. I. Zheludeva, N. D. Stepina, A. L. Tolstikhina, R. V. Ganutdinov, A. I. Erko, W. Haase, and Yu. G. Galyametdinov, Crystallography Reports, (2006),, 51, No. 6, 1041–1047
76. New insights into the colour origin of archaeological Egyptian Blue and Green by XAFS at the Cu K edge, S. Pagès-Camagna, I. Reiche, Ch. Brouder, D. Cabaret, S. Rossano, B. Kanngießer, A. Erko, X-Ray Spectrometry (2006), 35, 141-145
77. Application of μ-XAFS for the determination of the crystallization ratio in a series of vitro-ceramic materials containing industrial waste, F. Pinakidou, M. Katsikini, E. C. Paloura, P. Kavouras, Ph. Komninou, Th. Karakostas, A. Erko, Nuclear Instruments and Methods in Physics Research, B246 (2006) 238–243
78. On the coordination environment of Fe- and Pb-rich solidified industrial waste: an X-Ray absorption and Mössbauer study, F. Pinakidou, M. Katsikini, E. C. Paloura, P. Kavouras, Ph. Komninou, Th. Karakostas, A. Erko, Journal of Non-Crystalline Solids, 352 (2006) 2933–2942

2005
79. Nanometer focusing of x-rays with modified reflection zone plates, A.G. Michette, S.J. Pfauntsch, A. Erko, A. Firsov, A. Svintsov, Optics Communications, 245, (2005), 249–253.
80. XAFS studies on vitrified industrial waste, F. Pinakidou, M. Katsikini, E. C. Paloura, P. Kavouras, Ph. Komninou, Th. Karakostas, A. Erko, Physica Scripta. Vol. T115, (2005), 931–932,
81. Study of annealing induced devitrification of stabilized industrial waste glasses by means of micro x-ray fluorescence mapping and absorption fine structure spectroscopy, F. Pinakidou, M. Katsikini, E. C. Paloura, P. Kavouras, Ph. Komninou, Th. Karakostas, A. Erko, Journal of Non-Crystalline Solids 351 (2005) 2474–2480
82. Исследование белково-липидных мембранных моделей с помощью рентгенофлуоресцентных методик, Н.Н. Новикова, Э. А. Юрьева, С.И. Желудева, М.В. Ковальчук, Н.Д. Степина, О.В. Коновалов, А.Л. Толстихина, Р.В. Гайнутдинов, Д.В. Урусова, Т.А. Матковская, А.М. Рубцов, О.Д. Лопина, А.И. Ерко, Поверхность. Рентгеновские, синхротронные и нейтронные исследования, (2005), № 8, с. 67-73.
83. X-ray fluorescence methods for investigations of lipid/protein membrane models, N. N. Novikova, E. A. Yurieva, S. I. Zheludeva, M. V.Kovalchuk, N. D. Stepina, A. L. Tolstikhina, R. V. Gaynutdinov, D. V. Urusova, T. A. Matkovskaya, A. M. Rubtsov, O. D. Lopina, A. I. Erko and O. V. Konovalov, Journal of Synchrotron Radiation, (2005). 12, 511–516

2004
84. The BESSY X-Ray Microfocus Beamline project, A. Erko, F. Schäfers, A. Firsov, W.B. Peatman, W. Eberhardt, R. Signorado, Spectrochimica Acta, 2004, Part B 59, 1543-1548
85. Investigation of Oxidation and Migration Processes of Inorganic Compounds in Ink Corroded Manuscripts, B. Kanngießer, O. Hahn, M. Wilke, B. Nekat, W. Malzer, A. Erko, Spectrochimica Acta A, 2004, Part B 59, 1511-1516
86. Micro-X-Ray absorption near edge structure spectroscopy investigations of baroque tin-amalgam mirrors at BESSY using a capillary focusing system, J. Bartoll, S. Röhrs, A. Erko, A. Firsov, A. Bjeoumikhov, N. Langhoff, Spectrochimica Acta A, 2004, Part B 59, 1587-1592

2003
87. Combined molecular beam epitaxy and diffractometer system for in situ x-ray studies of crystal growth, B. Jenichen, W. Braun, V. M. Kaganer, A. G. Shtukenberg, L. Däweritz, C.-G. Schulz, K. H. Ploog, A. Erko, Review of Scientific Instruments, (2003), 74(3), 1267-1273
88. Possibilities of X-ray Fluorescence in the Region of Total External Reflection for Studying Langmuir Monolayers on the Surface of a Liquid and Solid Substrate, S. I. Zheludeva , N. N. Novikova, O. V. Konovalov, M. V. Kovalchuk , N. D. Stepina , E. A. Yur’eva, I. V. Myagkov , Yu. K. Godovski , N. N. Makarova , A. M. Rubtsov, O. D. Lopina , A. I. Erko, A. L. Tolstikhina , R. V. Gainutdinov , V. V. Lider , E. Yu. Tereshchenko, and L. G. Yanusova, Crystallography Reports (2003), Vol. 48, Suppl. 1, 25

2002
89. The first synthetic X-ray hologram: results, A. Firsov, A. Svintsov, S.I. Zaitsev, A. Erko, V. Aristov, Optics Communications, (2002), 202, 55–59
90. Laterally-Graded SiGe Crystals for High Resolution Synchrotron Optics, A. Erko, N. V. Abrosimov, V. Alex, Cryst. Res. Technol., (2002), 37, Nr.7, 685–704

2001
91. Crystal-based diffraction Focusing Elements for Third-Generation Synchrotron Radiation Sources, A. Firsov, A. Svintsov, A. Erko, W. Gudat, S. Kuznetsov, M. Grigoriev, A. Asryan, M. Ferstl, S. Shapoval, V. Aristov, Nuclear Instruments and Methods in Physics Research, (2001), A467–A468, 366–369
92. High-Order Harmonic Suppression by a Glass Capillary Array, A. Erko, N. Langhoff, A.A.Bjeoumikhov, V.I. Beloglasov, Nuclear Instruments and Methods in Physics Research, (2001), A 467–468, 832–835
93. The Crystal Monochromator Based on graded SiGe Crystals, A. Erko, I. Packe, W. Gudat, N. Abrosimov, A. Firsov, Nuclear Instruments and Methods in Physics Research, (2001), A467–468,. 358–361
94. Graded SiGe Crystals as X-Ray Collimators, P. Petrashen, A. Erko, Nuclear Instruments and Methods in Physics Research, (2001), A 467–468, 358–361

1999
95. Многослойные регистраторы пучков Брэгга-Френеля BESSY, А. Ерко, К. Холлдак, В. В. Питмaн, Т. Нолл, В. В. Аристов, А. Якшин. Л. Панченко, А. Коваль, В. Данилов, Поверхность. Рентгеновские, синхротронные и нейтронные исследования, (1999), N1, 170-174.
96. Градиентные кристаллы SiGe для монохроматизации синхротронного излучения, Е. В. Шулаков, В. Ш. Шехтман. С. С. Хасанов, И. А. Смирнова, А. И. Ерко, М. Фелъдкамп, Ф. Алекс, Н. В. Абросимов. С. Н. Россоленко, Поверхность. Рентгеновские, синхротронные и нейтронные исследования, (1999), N1, 92-97
97. Si1-xGex laterally graded crystals as monochromators for x-ray absorption spectroscopy studies, M. Veldkamp, A. Erko, W. Gudat, N. V. Abrosimov, V. Alex, S. Khasanov, V. Shekhtman, F. Neissendorfer, U. Pietsch, Jpn. J. Appl. Phys. Suppl. (1999), 38-1, 612-615

1998
98. Fixed Exit Double Crystal Monochromator with one single cooled crystal A. Souvorov, M. Drakopoulos, A. Freund, I. Snigireva, A. Snigirev, A. Erko, W. Gudat, N. Abrosomov, S Rossolenko, W. Schröder, Nuclear Instruments and Methods in Physics Research, (1998), A413, 427-430
99. Graded X-Ray Optics for Synchrotron Radiation Applications, Erko, M. Veldkamp, W. Gudat, N.V. Abrosimov, S.N. Rossolenko, V.Shekhtman, S. Khasanov, V. Alex, S. Groth, W. Schröder, B. Vidal, A. Yakshin, Journal of Synchrotron Radiation, (1998), 5, 239-245

1997
100. Synchrotron radiation beam splitting and filtering by a polycapillary array, V. Arkadiev, A. Bjeumikhov, A. Erko, F. Schafers, P. Chevallier, P. Populus, Nuclear Instruments and Methods in Physics Research A384, (1997), 547-551

1996
101. On the Feasibility of Employing Gradient Crystals for High Resolution Synchrotron Optics, A. Erko, F. Schäfers, W. Gudat, N.V. Abrosimov, S.N. Rossolenko, W. Alex, S. Groth, W. Schröder Nuclear Instruments and Methods in Physics Research, (1996), A374 408-412
102. The LURE-IMT X-Ray Fluorescence Photon Microprobe, P. Chevallier, P. Dhez, F. Legrand, A. Erko, Yu. Agafonov, L.A. Panchenko, A. Yakshin, J. Trace and Microprobe Techniques, (1996), 14 Nr.3, 517-539
103. X-Ray Microprobes, P. Chevallier, P. Dhez, A. Erko, A. Firsov, F. Legrand, P. Populus, Nuclear Instruments and Methods in Physics Research,, (1996), B113, 122-127
104. BESSY Bragg-Fresnel multilayer beam monitor, K. Holldack, A. Erko, W.B. Peatman, Rev. Sci. Instrum. (1996), 67, 3367

1995
105. X-ray Supermirrors for BESSY II, A. Erko, F. Schäfers, B. Vidal, A. Yakshin, U. Pietsch, W. Mahler, Review Scientific Instruments, (1995), 66, Nr.10, , 4845-4846
106. A Bragg-Fresnel Multilayer Beam Monitor for Third Generation Storage Rings, K .Holldack, A.I. Erko, T.Noll, W.B. Peatman, Nuclear Instruments and Methods in Physics Research 1995, A365, 40-45
107. Fabrication, structure and reflectivity of W/C and W/B4C multilayers for X-ray optics, E. Yakshin, I. I. Khodos, I. M Zhelezniak and A. I. Erko, Optics Communication 1995, 118, 133-142
108. First Test of the scanning X-Ray microprobe with Bragg-Fresnel multilayer lens at ESRF beamline P.Chevallier P.Dhez, F.Legrand, M.Idir, G.Soullié, A.Mirone, A.Erko, A.Snigirev, I.Snigireva, A.Suvorov, A.Freund, P.Engstroem, J. Als Nielsen, G.Grübel, Nuclear Instruments and Methods in Physics Research, 1995, A354, 584-587
109. Microplasma object imaging spectroscopy by using zone plate surface structure on mica crystal, Erko, L. A. Panchenko, S. A. Pikuz, A. R. Mingaleev, V. M. Romanova, T. A. Shelkovenko, A. Ya. Faenov, B. A. Bryunetkin, T. A. Pikuz, and I. Yu. Skobelev, Rev. Sci. Instrum. 66, 1047 (1995)

1994
110. Elliptical Multilayer Bragg-Fresnel Lenses with Submicron Spatial Resolution, A. Erko, Yu. Agafonov, L.A. Panchenko, A. Yuakshin, P. Chevallier, P. Dhez, F. Legrand, Optics Communications, 1994, 106, 146-150
111. Dinamical Theory for Bragg-Fresnel Multilayer Lenses for X-UV and X-Ray Range, A. Mirone, M. Idir, P. Dhez, G. Soullie, A.I. Erko, Optics Communications, 1994, 111, 191-198
112. Multilayer Bragg-Fresnel Optics: Design, Technology and Applications, A. Erko, Journal de Physique IV, 1994, C9, 4, 245-251
113. Comparison of Modal and Differential Method for Multilayer Gratings, M. Brunel, A. I. Erko, V. V. Martynov, B. Vidal, P. Vincent, A. Yuakshin, D. V. Roshchoupkin, Nuclear Instruments and Methods in Physics Research, 1994, A339, 617-625
114. Multilayer Diffraction Grating Properties, A. Erko, V.V. Martynov, D.V.Roshchupkin, A.Yuakshin, B.Vidal, P.Vincent, M.Brunel, Journal de Physique III, France, 1994, 4, 1649-1658
115. High-Performance X-Ray Spectroscopic Devices for Plasma Micro-sources Investigations Ya. Faenov, S.A. Pikuz, A.I. Erko, B.A. Bryunetkin, V.M. Dyakin, G.V. Ivanenkov, A.R. Mingaleev, T.A. Pikuz, V.M. Romanova, T.A. Shelkovenko, Physica Scripta, 1994, 50, 333-338

1993
116. Multilayer Gratings Efficiency: Nomerical and Physical Experiment, A. Erko, B.Vidal, P.Vincent, Yu. Agafonov, V.V. Martynov, D.V.Roshchupkin, M.Brunel, Nuclear Instruments and Methods in Physics Research, 1993, A333, 599-606
117. Imaging spectroscopy of microscopic plasmas by means of a mica crystal with a zone-plate surface structure, Yu. A. Agafonov, B. A. Bryunetkin, A. I. Erko, A. R. Mingaleev, S. A. Pikuz, V. T. Romanova, I. Yu. Skobelev, A. Ya. Faenov, and T. A. Shelkovenko, Quantum Electron. 1993, 23, 172

1992
118. Dynamic X-ray diffraction by a multilayer mirror modulated with a transverse acoustic wave, V.V. Aristov, A.I. Erko, V.V. Martynov, Journal of X-ray Science and Technology, 1992, Nr.3, 211-221
119. Obtaining the image of the „hot point“ of a fast Z pinch by means of a linear Bragg–Fresnel lens, Yu. A. Agafonov, B. A. Bryunetkin, A. I. Erko, A. P. Mingaliev, S. A. Pikuz, V. M. Romanova, I. Yu. Skobelev, A. Ya. Faenov, and T. A. Shelkovenko, Sov. Tech. Phys. Lett. 1992, 18, 533
120. Proxy – a New Approach for Proximity Correction in Electron Beam Lithography, V.V. Aristov, A.I.Erko, B.N.Gaifullin, A.A.Svintsov, S.I.Zaitsev, R.R.Jede, H.F.Raith, Microelectronic Engineering, 1992, 17, 413-416
121. X-ray Space Modulation by Diffraction on an Ultrasonic Superlattice, D.V. Roshchupkin, M. Brunel, F. de Bergevin, A.I. Erko, Nuclear Instruments and Methods in Physics Research, 1992, B72, 471-476
122. Kirpatrick-Baez Microscope Based on Bragg-Fresnel X-Ray Multilayer Lenses, P. Dhez, A.I. Erko, E. Khzmalian, B. Vidal, Appl. Optics,1992, 31, 6664-6668

1991
123. New materials for optical computing and holography, R. V. Ryabova, V. V. Ammosov, E. A. Arestova, S. G. Averyanov, V. L. Baranoy, Y. A. Bykovsky, A. I. Erko, L. G. Gnatyuk, M. H. Grosmann, M. L. Gurary, Yu. K. Kovneristy, A. I. Larkin, Yu. A. Mironov, O. V. Morgunov, A. V. Shelyakov, S. Wang and A. M. Zarubin, Material Science and Engineering B, 1991, 9(4), 463-467
124. Fabrication and Test of Multilayer Bragg-Fresnel Lenses, A.I. Erko, L.A. Panchenko, A.A. Firsov, V.I. Zinenko, Microelectronic Engineering, 1991, 13, 335-338

1990
125. Synthesized Bragg-Fresnel Multilayer Optics, A.I. Erko, Journal of X-Ray Science and Technology, 1990, 2, 297-316
126. Focusing properties of ellipsoidal Bragg-Fresnel multilayer lenses, A.I. Erko, A. A. Firsov, N. N. Salashchenko, Yu. Ya. Platonov, A. V. Zabelin, V. B. Rybakov, and E. P. Stepanov, Sov. Tech. Phys. Lett. 1990, 16, 38

1989
127. Multilayer Structure Modulated by Surface Acoustic Waves, G.V. Vereschagin, A.I. Erko, D.V. Roschupkin, A.M. Smolovich, Nuclear Instruments and Methods in Physics Research, 1989, A282, 634-637.
128. Fabrication of diffraction X-Ray Elements, S.V. Babin, A.I. Erko, Nuclear Instruments and Methods in Physics Research, 1989, A282, 529-531.
129. Synthesized Multilayer Fresnel X-Ray Optics, A.I. Erko, Review Scientific Instruments, 1989, 60, Nr,7, P28, 2502-2505.

1988
130. Principles of Bragg-Fresnel Multilayer Optics, V.V. Aristov, A.I. Erko, V.V. Martynov, Revue Phys. Appl., 1988, 23, Nr.5. 1623-1630.
131. Charging mechanism for the formation of a metastable surface-acoustic-wave potential contrast observed in a scanning electron microscope, N. N. Dremova, A. I. Erko, and D. V. Roshchupkin, Sov. Phys. Tech. Phys. 1988, 33, 1066
132. Optics and Spectroscopy on the Base of Talbot Effect, Sov. Journ. of Optics and Spectroscopy, V.V. Aristov, Erko A.I., Martynov V.V., 1988, 64, 630-637 (in Russian)
133. Fabrication of Presize Zone-Plates by E-Beam Lithography, S.V. Babin, A.V. Davydov, A.I. Erko, A.A. Svintsov, Surface: Physics, Chemistry, Mechanics, 1988, Nr.4, 79-82. (in Russian)
134. Plane Optics for Optical Lithography, G.A. Bashkina, S.V. Babin, A.V. Davydov, A.I.Erko, V.V. Martynov, Microelectronics, 1988, 17, P2, 184-186.

1987
135. Wave-front reconstruction using intensity distribution, V. V. Aristov, A. I. Erko, Ch. V. Kopetskii, S. M. Kuznetsov, and N. G. Ushakov, Sov. Journ. of Optics and Spectroscopy, 1987, 62, 653
136. Fresnel optics for the nanometer range, made with silicon single crystals, A.V. Davydov, A.I. Erko, L.A. Panchenko, S.V. Pedkin, G.D. Sazonova, V.A.Yunkin, Sov. Tech. Phys. Lett, 1987. 13, 424
137. Precise Lithography for Component Integral Optics of Nanometer Range, V.V. Aristov, S.V. Babin, A.V. Davydov, A.I. Erko, A.A. Svintsov, S.V. Redkin, Microelectronic Engineering. 1987, 6, 129-134.
138. Observation of x-ray diffraction by a multilayer structure modulated by an acoustic wave, V.V. Aristov, G.V. Vereschagin, A.I. Erko, L.A. Matveeva, D.V. Roschupkin, Sov. Tech. Phys. Lett. 1987, 13, 538
139. Research complex for electron-beam lithography, S.V. Babin, A.V. Davydov, A.I. Erko, Instrum. Exp. Tech. (Engl. Transl.); (United States); Journal Volume: 30:2; Translated from Prib. Tekh. Eksp.; 30: No. 2, 191-196 (Mar-Apr 1987)

1986
140. Focusing Properties of Shaped Multilayer Mirrors, V.V. Aristov, S.V. Gaponov , V.M. Genkin, Yu.A. Gorbatov, A.I. Erko, V.V. Martynov, L.A. Matveeva, N.N. Salashenko, A.A. Fraerman, JETP Lett. 1986, 44(4), 265-266
141. Observation of X-Ray Bragg Diffraction on the Periodic Surface Relief of a Perfect Silicon Crystal, V.V. Aristov, A.I. Erko, A.A. Snigirev, A.N. Nikulin, Optical Communications, 1986, 58, Nr.5, 300-302.

1985
142. Observation of Fourier Images in Soft X-Ray Radiation, V.V. Aristov, S. Aoki, A.I. Erko, S. Kikuta, V.V. Martynov, Optics Communications, 1985, 56, Nr.4, 223-255.
143. Prospects of High Resolution X-Ray Lithography, V.V. Aristov A.I. Erko V.A. Kudriashov, Microelectronic Engineering, 1985, 3, 589-595
144. Projection Image Transmission of Periodic Structures in Spatially Incoherent Radiation, V.V.Aristov, A.I.Erko, V.V. Martinov, Optics Communications, 1985, 53, Nr.3, 159-163.

1984
145. Device Fabrication by Nanolithography and Electroplating for Magnetic Flux Quantization Measurements, E. Kratchmer, H. Beneking, A.I. Erko, V.T. Petrashov, Appl. Phys. Lett., 1984, 44, (10), 1011-1013.

1983
146. Projection X-ray Lithography of Periodical Structure, V.V. Aristov G.A. Bashkina, L.V.Dorozkhina, A.I. Erko, V.V. Martynov, Surface: Physics, Chemistry and Mechanics, 1983, Nr.12, 113-118. (in Russian)

1982
147. An application of synthetic holograms for an investigation of local electrical fields by scanning electron microscopy, V.V. Aristov, G.A. Bashkina, A.I. Erko, Surface: Physics, Chemistry and Mechanics, 1982, Nr.7, 61-63.

1980
148. Principles of an optical recording on dichromate gelatin layers, A.I. Erko, A.N. Malov, Fundamental principles of optical memory and recording materials, Nr.11, Kiev, 1980, 62-63. (in Russian)
149. Modulation transfer function of the dichromate gelatin, A.N. Malov, A.I. Erko, Fundamental principles of optical memory and recording materials, Nr.11, Kiev, 1980, 68-72. (in Russian)
150. Optimization of dichromate gelatin development process for an optical hologram recording, A.N. Malov, A.I. Erko, Sov. Journ. Scientific and applied photography and cinematography, Nr.3, 1980, 185-187. (in Russian)
151. An application of optical filtration methods to X-ray images treatment V.V. Aristov, G.A. Bashkina, L.V. Dorogkina, A.I. Erko, in “Application of optical and holographic methods in information transfer”, ed. S.B. Gurevich, B.K. Sokolov, Leningrad, 1980, 146-150. (in Russian)
152. Holography of Microobjects in Soft X-Rays, V.V. Aristov, G.A. Bashkina, A.I. Erko, Opt. Communs. 1980, 34, Nr.3, 332-336.
153. Processing of X-Ray Images by Optical Filtration Methods, V.V. Aristov, G.A. Bashkina, A.I. Erko, Phys. Stat. Sol.,1980, 59a, 663-671.

1979
154. Semiconductor laser with a holographic selector, Yu. A. Bykovskii, A. I. Erko, and A. I. Larkin, Sov. J. Quantum Electron. 9, (1979), 231-232
155. Observation of a dip in the spontaneous emission spectrum and a saturation of generation in single-mode semiconductor lasers, V. F. Elesin, A. I. Erko, A. I. Larkin, JETP Lett. 29, (1979), 651

PATENTS
1. Device and method for determining the energetic composition of electromagnetic waves, A. Erko, N Langhoff, A Bjeoumikhov, , A Bjeoumikhov, US Patent 9,417,341.
2. Device for measuring resonant inelastic x-ray scattering of a sample, A. Erko, A. Föhlisch, J. K. Rehanek, Ch. Schüssler-Langeheine, EP 2870464 A1, DE102012013530 B3
3. Device for topographical characterisation and chemical mapping of surfaces D. Tonneau, J. Purans, C. Fauquet, F. Jandard, A. Erko, A. Bjeoumikhov, EP 2577325 A1
Conference talks and Proceedings

Invited talks
1. A. Erko, Invited speaker, Femtosecond Modular X-ray Spectrometer – Monochromator, PhotonDiag 2018, International Workshop, DESY, Hamburg, September 2018
2. A. Erko, Invited speaker, Reflection zone plate wavelength –dispercive X-ray spectrometry EMAS 2017 15th EUROPEAN WORKSHOP on MODERN DEVELOPMENTS AND APPLICATIONS IN MICROBEAM ANALYSIS, 7 – 11 May 2017, Konstanz, Germany
3. A. Erko, Invited speaker, 2-Dimensional VLS Gratings for X-ray Spectroscopy and Monochromators with Femtosecond Time Resolution, International Conference on X-ray optics and Applications 2017, 18-21 April 2017, Yokohama, Japan
4. A.Erko, Plenary speaker, State-of-the-art X-ray optical systems and their fabrication, 13th International Conference of the European Society for Precision Engineering & Nanotechnology, 27-31 May 2013, Berlin, Germany.
5. A. Erko Invited speaker, 3-D Reflection Zone Plates for X-Ray Monochromatization and Spectroscopy, SRI 2012, The 17th Pan-American Synchrotron Radiation Instrumentation Conference June 19-21, 2013 at NIST, Gaithersburg, MD USA
6. A. Erko Invited speaker, Activities in Europe (SXR), “X-ray Optics for BES Light Source Facilities”, Basic Energy Sciences Workshop on X-ray Optics for BES Light Source Facilities Potomac, MD, March 27 – 29, 2013
7. A. Erko, Invited speaker, Novell Röntgenoptische Systeme für Spektroskopie und Monochromatoren. Prozessnahe Röntgenanalytik PRORA, 22-23 November 2013, Berlin-Adlershof.
8. A. Erko, Invited speaker, Nanometer optics and technology, First German-Russian conference on knowledge and technology transfer in science, St. Petersburg State University, Russia, 16-18 December, 2011
9. A. Erko, Invited, Nanometer Optics Technologies at Helmholtz Centre Berlin. Joint final Conferenceof COST Actions IE0601 and MP0601: Wood Science for Cultural Heritage, 14-15/11/2011: Short Wavelength Laboratory Sources, 16-18/11/2011, Paris, France
10. A.- Erko, Member of International Scientific Advisory Boat, “Recent Developments in FS Soft X-ray Spectroscopy”, E-MRS 2011 Symposia, Workshop on X-ray Technique for Advanced Materials: Nice, France, 9-14 May 2011
11. A. Erko, N. Langhoff, I. Höhn, M. Haschke, Invited, Novel Wavelength-Dispersive Parallel X-ray Spectrometer, PRORA, 18-19 November 2011
12. A. Erko, A. Firsov, Invited, Parallel fs spectrometer for soft x-rays, Workshop on X-ray Optics, Chernogolovka, Russia, 20-24 September 2010
13. A. Erko, Invited speaker, Integration of Diffraction Focussing Optics into RAY, SMEXOS: Simulation Methods for X-ray Optical Systems, February 24-25, 2009, Grenoble, France
14. A. Erko, Invited speaker, Hard X-Ray Microspectroscopy at BESSY II, SPIE Annual meeting Europe, Workshop: Challenge in Optics and Optoelectronics, Plaque, 23 April 2009, Czech Rep.
15. A. Erko, Invited speaker, X-ray micro/nano metrology at BESSY, 2-d School on Nanometrology, Chernogolovka, 28-30 May 2009, Russia
16. A. Erko, Invited speaker, member of International Scientific Advisory Boat, Synthesized X-Ray Holographic Optics, 2-nd School and Workshop on X-Ray Micro and Nanoprobes (XMNP 2009), June 14-22, 2009, Italy
17. A. Erko, Invited speaker, A. Firsov, K. Holldack, Ultra-High Time Resolved XAS, XX Panhellenic Conference on Solid State Physics and Material Science, Thessaloniki, September 20-23, 2009, Greece
18. A. Erko, Invited speaker, A. Firsov, K. Holldack, New Developments in Femto-Second Soft X-rays Spectroscopy, SRI-2009, Melbourne, September 26 – Ocrober 2, 2009, Austarlia
19. A. Erko, Invited speaker, Moderne Röngenoptiken für analytische Anwendungen an Synchrotron-beamlines und Labor, Fachtagung PRORA 2009, 26-27 November 2009, Berlin, Germany
20. A. Erko, Invited speaker, I. Zizak, X-Ray Micro-Spectroscopy at BESSY II, 54-th DAE Solid State Physics Symposium, MS University Baroda, Vadodara, December 14-18, 2009, India
21. A. Erko, Member of International Scientific Advisory Boat, A. Firsov, K. Holldack “RZP monochromator for Femto-second XANES at BESSY II”, E-MRS 2009 Symposia, Workshop on X-ray Technique for Advanced Materials: Strasbourg, 8-12 June 2009
22. A. Erko, Invited speaker, Coherent Diffraction Optics for VUV and X-rays, 404 Wilhelm and Else Heraeus-Seminar “Matter in Coherent Light”, March 17-20, 2008, Physikzentrum Bad Honnef, Germany
23. A. Erko, Invited, A. Firsov, “High-resolution Diffraction X-Ray Optics”, Optics and Precision Engineering, Proceedings of the 2007 Sino-German High Level Expert Symposium on X-ray Optics, Shanghai, Optics and Precision Engineering, 12, (2007), 1816-1822
24. A. Erko, Invited speaker, μXRFA and μEXAFS Measurements of Organic and Non-Organic Samples, SPIE Annual Meeting, Conf. Instruments, Methods and Missions for Astrobiology, San-Diego 2006, USA
Conference abstracts (recent)
1. R. Garcia-Diez, R. G. Wilks, S. Hendel, A. Erko, M. Bär, “Characterization of real-world electro-catalysts under operando conditions by soft x-ray spectroscopy”, 13th International Conference on Synchrotron Radiation Instrumentation (SRI 2018), Abstracts, Poster, 119
2. A. Erko A. Hafner, L. Anklamm, An. Firsov, Al. Firsov, H. Löchel, A. Sokolov, R. Gubzhokov “iZPSSEM: the new spectrometer for ultra-light elements”, PRORA Tagung, 11-13 November 2015, Berlin-Adlershof, Germany
3. M. Brzhezinskaya, A. Firsov, A. Erko, New Reflection Zone Plate Array Optics with Individual Depth Profiles for Ultra-fast X-Ray Applications, Abstract, 12th International conference SRI-2015, New York City, July 6-10, 2015
4. An. Firsov, Al. Firsov, H. Löchel, J. Probst, P. Loukas, A. Erko, Abstract, 3-Dimensional profiling for diffraction optical elements, SPIE, SPIE Optics + Optoelectronics, Prague, Czech Republic 13 – 16 April 2015, 9510-18
5. H. Löchel, Ch. Braig, M. Brzhezinskaya, F. Siewert, P. Baumgärtel, A. Firsov, and A. Erko Spectroscopy with Reflection Zone Plates, 2nd German-Swedish Workshop on X-ray Optics, Berlin, 28-30 April 2015
6. A. Hafner, A. Firsov, H. Löchel, J. Probst, A. Firsov and A. Erko Reflection zone plates for XUV fluorescence spectrometer, 2nd German-Swedish Workshop on X-ray Optics, Berlin, 28-30 April 2015
7. A. Fernandez‐Herrero, Ch. Braig, H. Löchel, A. Firsov, M. Brzhezinskaya, and A. Erko Multi‐wavelength reflection zone plate arrays for wide‐range soft X‐ray spectroscopy, 2nd German-Swedish Workshop on X-ray Optics, Berlin, 28-30 April 2015
8. F. Senf, F. Bijkerk, F. Eggenstein, A. Erko, G. Gwalt, Q. Huang, R. Kruijs, O. Kutz, S. Lemke, M. Mertins, I. Packe, I. Rudolph, F. Schäfers, F. Siewert, A. Sokolov, Ch. Waberski, Z. Wang, J. Wolf, T. Zeschke, Performance of a blazed multilayer grating for energies between 800 eV and 5000 eV, calculations and measurements, , 2nd German-Swedish Workshop on X-ray Optics, Berlin, 28-30 April 2015
9. S. Vadilonga, I. Zizak, A. Erko, and D. Roshchupkin, Active X‐ray Optics, 2nd German-Swedish Workshop on X-ray Optics, Berlin, 28-30 April 2015
10. D. Roshchupkin, L. Ortega, O. Plotitcyna, A. Erko, I. Zizak Time‐resolved X‐ray optics based on ultrasonic superlattices, 2nd German-Swedish Workshop on X-ray Optics, Berlin, 28-30 April 2015
11. A.A. Sokolov, F Eggenstein, A Erko, R Follath, S Künstner, M Mast, JS Schmidt, F Senf, F Siewert, T Zeschke, F Schäfers, An XUV optics beamline at BESSY II, SPIE Optical Engineering+ Applications, 2014, 92060J-92060J-13
12. A. Erko, Novell 2D-3D optical systems for X-ray spectroscopy, European Conference on X-Ray Spectrometry (EXRS), Bologna, Italy, June 2014
13. H. Loechel, Ch. Braig, R. Mitzner, W. Quevedo, P. Loukas, M. Kubin, Ch. Weniger, A. Firsov, J. Rehanek, M. Brzhezinskaya, P. Wernet, A. Föhlisch, A. Erko, Design of a highly efficient parallel X-ray spectrometer for low signal analysis, European Conference on X-Ray Spectrometry (EXRS), Bologna, Italy, June 2014
14. A. Hafner, A. Erko, A. Firsov, R. Gubzhokov, A. Bjeoumikhov, A. Günther, N. Langhoff, M. Bretschneider, Y. Höhn, R. Wedell, Wavelength – dispersive spectrometer based on a scanning electron microscope, European Conference on X-Ray Spectrometry (EXRS), Bologna, Italy, June 2014
15. H. Löchel, J. Probst, C. Braig, P. Loukas, A. Fernandez Herrero, A. Firsov, A. Erko, Design of reflection zone plates for X-ray spectroscopy and monochromatization, , Deutsche Tagung für Forschung mit Synchrotronstrahlung, Neutronen und Ionenstrahlen an Großgeräte. Bonn, 21.-23. September 2014
16. M. Brzhezinskaya, A. Firsov, A. Erko Ultra-high time resolution optical systems based on diffractive 2D and 3D elements, XRM 2014, Melbourne, Australia, November 2014
17. A. Firsov, A. Erko, Total external reflection three-dimensional X-ray diffraction optical elements for high harmonic generators and free electron lasers experiments, Deutsche Tagung für Forschung mit Synchrotronstrahlung, Neutronen und Ionenstrahlen an Großgeräte. Bonn, 21.-23. September 2014
18. A. Erko, Novell 2D-3D optical systems for X-ray monochromators and spectroscopy with accelerator driven photon sources Deutsche Tagung für Forschung mit Synchrotronstrahlung, Neutronen und Ionenstrahlen an Großgeräte. Bonn, 21.-23. September 2014
19. A. Fernandez Herrero, H. Löchel, C. Braig, A. Firsov, F. Senf, M. Brzhezinskaya, and A. Erko High-resolution Parallel Soft X-ray Spectroscopy with a Single Optical Element, Deutsche Tagung für Forschung mit Synchrotronstrahlung, Neutronen und Ionenstrahlen an Großgeräte. Bonn, 21.-23. September 2014
20. M. Brzhezinskaya, A Firsov, A Erko, Diffractive 3D XUV optics at Helmholtz-Zentrum Berlin, recent developments, M SPIE Optical Engineering+ Applications, (2014), 92070C-92070C-6
21. A. Firsov, A Svintsov, A Erko, Diffractive focusing optics design at Helmholtz-Zentrum Berlin, A Firsov, M Brzhezinskaya, A SPIE Optical Engineering Applications, (2014), 920712-920712-6

Conference proceedings
1. Survey and Adjustment Methods Applied on an 11 Axes High Performance Reflectometer for Synchrotron Radiation, F. Eggenstein, P. Bischoff, F. Schaefers, T. Schroeter, F. Senf, A. Sokolov, T. Zeschke, A. Erko, A.) AIP Conference Proceedings, (2016);1741, 030025
2. RAY-UI: A Powerful and Extensible User Interface for RAY, P. Baumgaertel, M. Witt, J. Baensch, M. Fabarius,A. Erko, F. Schaefers, H. Schirmacher, Edited by: Shen, Q; Nelson, AIP Conference Proceedings (2016), 1741, 040016
3. Alexander Firsov, Maria Brzhezinskaya, Heike Loechel, Frank Siewert, Alexei Erko, The impact of novel 3D diffraction optics development, Proc. of SPIE (2013), Vol. 8777 877713-1
4. Maria Brzhezinskaya, Alexander Firsov, Karsten Holldack, Torsten Kachel, Rolf Mitzner, Niko Pontius, Christian Stamm, Jan-Simon Schmidt, Alexander Föhlisch, Alexei Erko1 A Novel monochromator for ultrashort soft X-ray pulses, Proc. of SPIE (2013), Vol. 8777 87771J-1
5. Christiane Becker, Jolly Xavier, Veit Preidel, Philippe Wyss, Tobias Sontheimer, Bernd Rech, Jürgen Probst, Christoph Hülsen, Bernd Löchel, Alexei Erko, Sven Burger, Frank Schmidt, Franziska Back, and Eveline Rudigier-Voigt Nanophotonic light trapping in polycrystalline silicon thin-film solar cells using periodically nanoimprint-structured glass substrate, Proc. of SPIE (2013), Vol. 8824 88240D-1
6. A. Firsov, A. Erko, F. Senf, J. Rehanek, M. Brzhezinskaya, R. Mitzner, Ph. Wernet, A, Föhlisch, Novel wavelength-dispersive X-ray fluorescence spectrometer, J. Phys.: Conf. Ser. 425 152013
7. J. Rehanek, F. Schäfers, H. Löchel, A. Firsov, J. Grünert, W. Freund, C. Ozkan, S. Molodtsov, A. Erko, A case study of novel X-ray Optics for FEL sources Journal of Physics: Conference Series 425 (2013) 052013
8. H Löchel, M Brzhezinskaya, A Firsov, J Rehanek and A Erko, Reflection zone plates for 2D focusing and spectroscopy of hard X-rays Journal of Physics: Conference Series 425 (2013) 052025
9. B. Loechel, A. Erko, St. Lemke, B. Nelles, M. Schmidt, F. Senf Installation of a technological center for highly efficient optical gratings at Helmholtz-Zentrum Berlin (HZB), Journal of Physics: Conference Series 425 (2013) 212012
10. A. Firsov, M. Brzhezinskay, A. Firsov, A. Svintsov, A. Erko, Dedicated software for diffractive optics design and simulation Journal of Physics: Conference Series 425 (2013) 162004
11. Cigdem Ozkan, Wolfgang Freund, Jens Rehanek, Jens Buck, Ivo Zizak, Jan Gruenert, Franz Schaefers, Alexei Erko, Sergeui Molodtsov, Initial Evaluation of the European XFEL Undulator Commissioning Spectrometer with a Single Channel-Cut Crystal Proc. of SPIE (2012) Vol. 8504 85040X-1
12. J. Rehanek, F. Schäfers, A. Erko, M. Scheer, W. Freund, J. Grünert, C. Ozkan, S. Molodtsov, Simulations of diagnostic spectrometers for the European XFEL using the raytrace tool RAY, Proc. of SPIE (2011), Vol. 8141 814109-1
13. D. Korytár, C. Ferrari, P. Mikulík, P. Vagovič, E. Dobročka, V. Áč, P. Konopka, A. Erko, N. Abrosimov, and Z. Zápražný 1D X-ray Beam Compressing Monochromators, AIP Conference Proceedings 1221, 2010, 177 59-62
14. Erko A., A. Firsov, K. Holldack, New Developments in Femto-Second Soft X-rays Spectroscopy, AIP Conference Proceedings 1234, 2010, 177-180
15. A. Shcherbinin; S. Dabagov; V. Mikhailin; W. Leitenberger; A. Erko Synchrotron radiation focusing by polycapillary lens, Proc. SPIE Vol. 5943 X-ray and Neutron Capillary Optics II, Muradin A. Kumakhov; Richard B. Hoover, Editors, 59430I, 2006
16. Alexei Erko, “μXRFA and μEXAFS Measurements of Organic and Non-Organic Samples”, Proc. SPIE Vol. 6309, 63090W, Instruments, Methods, and Missions for Astrobiology IX; Richard B. Hoover, Gilbert V. Levin, Alexei Y. Rozanov; Eds. 2006
17. F. Pinakidou, M. Katsikini, E. C. Paloura, P. Kavouras, Ph. Komninou, Th. Karakostas, A. Erko, Study of glasses containing Zn- and Fe- contaminated Electric Arc Furnace Dust by means of μ-XRF mapping and μ-XAFS, Proc. of the International Conference on Engineering for Waste treatment, Albi, France, 2005.
18. Alexandre Firsov, Alexei I. Erko, Alexander Svintsov “Design and fabrication of the diffractive x-ray optics at BESSY”, Design and Microfabrication of Novel X-Ray Optics II; Anatoly A. Snigirev, Derrick C. Mancini; Eds. Proc. SPIE Vol. 5539, (2004), p. 160-164
19. Alexei I. Erko, Alexandre Firsov, “Investigation of the properties of Bragg-Fresnel gratings”, Design and Microfabrication of Novel X-Ray Optics II; Anatoly A. Snigirev, Derrick C. Mancini; Eds. Proc. SPIE Vol. 5539, (2004), p. 148-159
20. Alexei Erko, Franz Schaefers, Nikolay Artemiev, “A ray-tracing code for zone plates” Advances in Computational Methods for X-Ray and Neutron Optics; Manuel Sanchez del Rio; Ed. Proc. SPIE Vol. 5536, (2004), p. 61-70,
21. Alexei I. Erko, Ingo Packe, Wolfgang Gudat, Nikolai V. Abrosimov, Alexander A. Firsov “Graded crystal monochromator at Bessy II”, Advances in X-Ray Optics; Andreas K. Freund, Tetsuya Ishikawa, Ali M. Khounsary, Derrick C. Mancini, Alan G. Michette, Sebastian Oestreich; Eds. Proc. SPIE Vol. 4145, p. 122-128 (2001)
22. Erko „Spatially Modulated Advanced X-Ray Optics“ Materials Science Forum, 321-324 Trans Tech Publications, Switzerland, 2000, P. 174-178
23. Erko, I. Packe, C. Hellwig, M. Fieber-Erdmann, O. Pawlitzki, M. Veldkamp, W. Gudat, KMC-2 : the new X-ray beamline at BESSY II, Proceedings of the 11th US National Conference on Synchrotron Radiation Instrumentation, SRI99, AIP Conference Proc. 521, 2000, P. 415-418
24. Vladimir A. Arkadiev, Alexander Baranov, Alexei I. Erko, Pavel E. Kondrashov, Norbert Langhoff, Elena G. Novoselova, Igor S. Smirnov, Markus Veldkamp, Ingo Packe “Carbon/carbon multilayers for synchrotron radiation”, X-Ray Optics Design, Performance, and Applications; Ali M. Khounsary, Andreas K. Freund, Tetsuya Ishikawa, George Srajer, Jonathan C. Lang; Eds. Proc. SPIE Vol. 3773, p. 122-127 (1999)
25. M. Veldkamp, A. Erko, F. Schäfers, W. Gudat, N. Abrosimov, V. Alex, S. Rossolenko, V. Shekhtman, E. Shulakov, S. Khasanov, I. Smirnova, “Examination of Si1-xGex laterally graded crystals for use in high brilliance synchrotron beams”, Proceedings of the 5th International Symposium on Functionally Graded Materials (FGM ’98), Materials Science Forum, 308-311, Trans Tech Publications, 1999, P. 597-602
26. Alexei Souvorov, Nikolai V. Abrosimov, Michael Drakopoulos, Alexei I. Erko, Wolfgang Gudat, Andreas K. Freund, S. Rassolenko, W. Schroeder, Irina Snigireva, Anatoly A. Snigirev, “New fixed-exit double-crystal monochromator with one cooled crystal”, High Heat Flux and Synchrotron Radiation Beamlines; Albert T. Macrander, Ali M. Khounsary; Eds. Proc. SPIE Vol. 3151, p. 338-341, (1997)
27. Veldkamp, A. Erko, W. Gudat, N. V. Abrosimov, V. Alex, Scanning x-ray method for measurements on Si1-xGex-crystals, Proceedings of the 7th International Conference on Defect Recognition and Image Processing in Semiconductors (DRIP VII), Institute of Physics Conference Series, Nr.160, IOP Publishing, 1997, P. 195-198
28. Alexei I. Erko, Franz Schaefers, Wolfgang Gudat, K. J. Sawhney, Nikolai V. Abrosimov, S. N. Rossolenko, V. Alex, S. Groth, W. Schroeder, Laterally graded Si1-xGex crystals for high-resolution synchrotron x-ray optics, Optics for High-Brightness Synchrotron Radiation Beamlines II; Lonny E. Berman, John Arthur; Eds. Proc. SPIE Vol. 2856, p. 110-119 (1996)
29. Alexei I. Erko, Franz Shaefers, Bernard Vidal, Andrey E. Yakshin, Pierre Chevallier, “X-ray supermirrors for BESSY-II”, X-Ray Microbeam Technology and Applications; Wenbing Yun; Ed. Proc. SPIE Vol. 2516, p. 206-209 (1995)
30. Karsten Holldack, Alexei I. Erko, William B. Peatman, “BESSY Bragg-Fresnel multilayer beam monitor”, X-Ray Microbeam Technology and Applications; Wenbing Yun; Ed. Proc. SPIE Vol. 2516, p. 210-216, (1995)
31. Alexei I. Erko, Alexander A. Firsov, Andrey E. Yakshin, Pierre Chevallier, Pierre Dhez, “New generation of multilayer Bragg-Fresnel lenses”, X-Ray Microbeam Technology and Applications; Wenbing Yun; Ed. Proc. SPIE Vol. 2516, p. 38-40, (1995)
32. Anatoly Y. Faenov, Yu A. Agafonov, B. A. Bryunetkin, Alexei I. Erko, G. V. Ivanenkov, A. R. Mingaleev, Sergey A. Pikuz, Vera M. Romanova, Tatyana A. Shelkovenko, Igor Y. Skobelev “High-performance x-ray spectroscopy of plasma microsources”, Applications of Laser Plasma Radiation; Martin C. Richardson; Ed. Proc. SPIE Vol. 2015, p. 64-75 (1994)
33. Erko „Bragg-Fresnel Multilayer Optics for Microscopy and Spectroscopy“, in Proc. of the 4-th International Conference on X-Ray Microscopy, ed. V.V. Aristov, A.I. Erko, 1994, “Bogorodsky Pechatnik”,P. 601-610
34. F. Legrand, A. Erko, P. Dhez, P. Chevallier, C. Legrand „LURE – IMT X-Ray Fluorescence microprobe: Resolution and performances“, in Proc. of the 4-th International Conference on X-Ray Microscopy, ed. V.V. Aristov, A.I. Erko, 1994, “Bogorodsky Pechatnik”, P. 136-141
35. Youry A. Agafonov, Sergey V. Babin, Alexei I. Erko, Alexander A. Shestakov, Igor A. Schelokov “Fabrication of diffractive optical elements for x-ray range”, Miniature and Micro-Optics and Micromechanics; Neal C. Gallagher, Jr., Chandrasekhar Roychoudhuri; Eds. Proc. SPIE Vol. 1992, p. 299-306 (1993)
36. S.V. Babin, A.I. Erko, „Electron Beam Lithography of Optical Elements for X-Ray Range“, Proc. of the International conference on Microlithography, San-Diego, Proc. SPIE Vol. 1671, P. 215-221 (1992)
37. Erko, P. Chevallier, P. Dhez, F. Legrand, B. Vidal, Scanning X-Ray Microprobe with Multilayer Bragg-Fresnel Lens“ Inst. Phys. Conf. Ser. 130 „Proc. of the XIII International Conference on X-Ray Optics and Microanalysis“ IOP Publishing, 1992, p.617-618
38. P. Chevallier, P. Dhez, A. Erko, E. Khzmalian, C. Khan-Malek, A. Freund, L. Panchenko, S. Redkin, V. Zinenko, B. Vidal, „First test of the Bragg–Fresnel Multilayer X-Ray Fluorescence Microscope at LURE“ in X-Ray Microscopy III, Proceed. of the 3-d International Conference on X-Ray Microscopy XRM-90 ed. by A.G. Michette, G.R. Morrison, Springer, 1992, P.391-398.
39. V.V. Aristov, A.I. Erko, A.A. Firsov, S.V. Gaponov, N.N. Salashchenko, A.V. Zabelin, B.V. Rybakov, E.P. Stepanov, „Focusing of Soft X-Ray Radiation by an Ellipsoidal Bragg-Fresnel Lenz“, Conference Proceedings, 25-1, „2nd European Conference in X-Ray Synchrotron Radiation Research“, A.Balena, E.Bernieri, S.Mobilio (Eds.) SIF, Bolongna 1990, p.275-278.
40. V.V. Aristoiv, A.I .Erko, E.R. Khzmalian, “Silicon-Based Phase Zone Plate for X- Rays”. Conference Proceedings, 25-1, „2nd European Conference in X-Ray Synchrotron Radiation Research“ A.Balena, E.Bernieri, S.Mobilio (Eds.) SIF, Bolongna, 1990, P.273-275.
41. S.V. Babin, A.I. Erko, A.A. Svintsov, “E-Beam Lithography of non-periodical structures”, Proceedings of International Conference of E-Beam Technology, Varna, Bulgaria, 1988, P.379-385.
42. V.V. Aristov, A.I. Erko, L.A. Panchenko, V.V. Martynov, S.V. Redkin , G.D. Sazonova „Zone Plates for the Nanometer Wavelength Range“, Spriger Series in Optical Science 56 X-Ray Microscopy II Ed. by D.Sayre, M.Howells, J.Kirz, H.Rarback, 1987, P.138-141.
43. V.V. Aristov, A.I. Erko, V.V. Martynov „X-Ray Fourier Optics“, AIP Conference Proceedings, Nr.147, „Short Wavelength Coherent Radiation: Generation and Application“, ed. by D.Attwood, J.Bocor, 1986, P.71-80.
44. V.V. Aristov, V.A. Agafonova, A.I. Erko, D.V. Roschupkin, “Investigation of Proximity Effect Influence on Resist Properties”, Proceedings of International Conference of E-Beam Technology, Varna, Bulgaria, 1985, P.501-504.
45. V.V. Aristov, A.I. Erko, S.V. Babin, L.V. Dorozhkina, “Investigation of Proximity Effect in E-Beam Lithography”, Proceedings of International Conference on Microlithography, Cambridge, 1983, P.56-63.
46. V.V. Aristov, A.I. Erko, Ch.V. Kopetski, “Prospects for the Applications of Methods of Diffraction Optics to X-Ray Lithography”, Proceedings International Conference on Microlithography, Grenoble, 1982, P.137-141.
47. A.I. Erko, V.V. Aristov, “Perspectives of microscopy and holography in soft X-rays”, in ”Physical principles of holography”, Proceeding of the XIII School in Holography, Leningrad, 1981, P. 181-208. (in Russian)
48. A.I. Erko A.N. Malov, “Hologram recording on a dichromate gelatin layer with latent image control”, Quantum Electronics, Proceedings of Leningrad Polytechnic Institute, Nr. 366, Leningrad, 1979, P. 107-110 (in Russian)

References: Books

  1. Рентгеновская Оптика, В.В. Аристов, А.И. Ерко, Наука, Москва, 1991, 120 стр
  2. X-Ray Microscopy IV, Proc. of the 4-th International Conference on X-Ray Microscopy, Chernogolovka, Russia, 1994 eds. V.V. Aristov , A.I. Erko „Bogorodsky Pechatnik“ 1995
  3. Diffraction X-Ray Optics, A.I. Erko V.V.Aristov, B.Vidal, „“ IOP Publishing, Bristol, 1996, 150 P.
  4. X-Ray Optics, in “Handbook of Practical X-Ray Fluorescence Analysis” eds. B. Beckhoff et al., Springer, 2006, 85-190
  5. Modern Developments in X-Ray and Neutron Optics, Eds. A. Erko, M. Idir, Th. Krist, A. G. Michette, Springer, 2008