Professor Erko received his PhD degree in experimental physics at the
Moscow Physical Engineering Institute in 1981 and his habilitation in
physics (Doctor of Science) in 1991. He became Professor of Experimental
Physics in 1993.
From 1978 to 1994, he was employed at the Institute of Solid State
Physics and the Institute of Microelectronics Technology of the Russian
Academy of Sciences in Chernogolovka, Moscow district, initially as
Senior Scientist and then later as Head of the “X-ray Optics and
Technology Laboratory”.
In 1994, he came to Berlin to do research at the storage ring BESSY II,
where he worked for the BESSY GmbH Berlin as Senior Scientist from 1994
to 2009, and then from 2009 to 2010 as Senior Scientist for the
Helmholtz Centre Berlin for Materials und Energy GmbH (HZB).
In 2010, he became Head of the Institute for Nanometre Optics and Technology.
His research interests focus especially on x-ray optics, x-ray
holography and synchrotron radiation beamline design. He is co-author of
two monographs and co-editor of two books on x-ray optics and x-ray
microscopy.
Professor Erko successfully organized the lecture series for master
students on the topic “Modern X-ray and Neutron Methods for Science and
Technology” at the Free University Berlin since winter semester
2009/2010.
In 2011, he was appointed Honorary Professor for Experimental Physics by the president of the Freie Universität Berlin.
After his Helmholtz Centre Berlin for Materials and Energy GmbH (HZB)
career he joined the IAP as its Scientific Director in March 2018. Also
in 2018 the Association of Friends of HZB awarded him with the European
Innovation-Award on Synchrotron Radiation.
Personal publication history 1979-2018 (Journal references)
2018
1. Gratings for synchrotron and FEL beamlines: a project for the
manufacture of ultra-precise gratings at Helmholtz Zentrum Berlin, F.
Siewert, B. Löchel, J. Buchheim, F. Eggenstein, A. Firsov, G. Gwalt, O.
Kutz, St. Lemke, B. Nelles, I. Rudolph, F. Schäfers, T. Seliger, F.
Senf, A. Sokolov, Ch. Waberski, J. Wolf, T. Zeschke, I. Zizak, R.
Follath, T. Arnold, F. Frost, F. Pietag, A. Erko, J. Synchrotron Rad.
(2018). 25, 91-99
2.Probing the oxidation state of transition metal complexes: a case
study on how charge and spin densities determine Mn L-edge X-ray
absorption energies, M. Kubin, M. Guo, T. Kroll, Heike Löchel, E.
Källman, M. L. Baker, R. Mitzner, S. Gul, J. Kern, A Föhlisch, A. Erko,
U. Bergmann, V. Yachandra, J. Yano, M. Lundberg, P. Wernet, Chemical
Science, (2018), 9, 6813-6829
3. X-ray spectroscopy with variable line spacing based on reflection
zone plate optics Z. Yin, H. Löchel, J. Rehanek, C. Goy, A. Kalinin, A.
Schottelius, F. Trinter, P. Miedema, A. Jain, J. Valerio, P. Busse, F.
Lehmkühler, J. Möller, G. Grübel, A. Madsen, J. Viefhaus, R. E.
Grisenti, M. Beye, A. Erko, S. Techert, Optics Letters (2018), 43, 18,
4390-4393
2017
4. Polycapillary-boosted instrument performance in the extreme
ultraviolet regime for inverse photoemission spectroscopy, C. Braig, A.
Sokolov, R. G. Wilks, E. Kozina, T. Kunze, S. Bjeoumikhova, M. Thiel, A.
Erko, M. Bär, (2017), Optics Express, 25(25), 31840-31852
5. Highly efficient soft X-ray spectrometer based on a reflection zone
plate for resonant inelastic X-ray scattering measurement, Z. Yin, J.
Rehanek, H. Löchel, C. Braig, J. Buck, A. Firsov, J. Viefhaus, A. Erko,
S. Techert, (2017), Optics Express, 25(10), 10984-10996
6. Soft x-ray absorption spectroscopy of metalloproteins and high-valent
metal-complexes at room temperature using free-electron lasers, M.
Kubin, J. Kern, S. Gul, T. Kroll, R. Chatterjee, H. Löchel, F. D.
Fuller, R. G. Sierra, W. Quevedo, C. Weniger, J. Rehanek, A. Firsov, H.
Laksmono, C. Weninger, R. Alonso-Mori, D. L. Nordlund, B.
Lassalle-Kaiser, J. M. Glownia, J. Krzywinski, S. Moeller, J. J. Turner,
M. P. Minitti, G. L. Dakovski, S. Koroidov, A. Kawde, J. S. Kanady, E.
Y. Tsui, S. Suseno, Z. Han, E. Hill, T. Taguchi, A. S. Borovik, T.
Agapie, J. Messinger, A. Erko, A. Föhlisch, U. Bergmann, R. Mitzner, V.
K. Yachandra, J. Yano, P. Wernet, Structural Dynamics (2017), 4, 054307
7. Pulse picker for synchrotron radiation driven by a surface acoustic
wave, S. Vadilonga, I. Zizak, D. Roshchupkin, A. Petsiuk, I. Dolbnya, K.
Sawhney, A. Erko, Opt. Lett. (2017), 42(10), 1915-1918
8. Observation of sagittal X-ray diffraction by surface acoustic waves
in Bragg geometry, S. Vadilonga, I. Zizak, D. Roshchupkin, E. Emelin, A.
Petsiuk, W. Leitenberger, A. Erko, J. Appl. Cryst. (2017), 50, 525–530
9. Reflection zone plate concept for resonant inelastic x-ray scattering
spectrometry, C. Braig, H. Löchel, J. Rehanek, A. Firsov, M.
Brzhezinskaya, A. Erko, Applied Optics, (2017), 56 (3), 515-520
10. Two-dimensional X-ray focusing by off-axis grazing incidence phase
Fresnel zone plate on the laboratory X-ray source, M. Grigoriev, R.
Fakhrtdinov, D. Irzhak, Al. Firsov, An. Firsov, A. Svintsov, A. Erko, D.
Roshchupkin, Optics Communications, (2017), 385, 15-18
2016
11. X-ray absorption spectroscopy using a self-seeded soft X-ray
free-electron laser, Th. Kroll, J. Kern, M. Kubin, D. Ratner, S. Gul, F.
D. Fuller, H. Löchel, J. Krzywinski, A. Lutman, Y. Ding, G. L.
Dakovski, S. Moeller, J. J. Turner, R. Alonso-Mori, D. L. Nordlund, J.
Rehanek, C. Weniger, A. Firsov, M. Brzhezinskaya, R. Chatterjee, B.
Lassalle-Kaiser, R. G. Sierra, H. Laksmono, E. Hill, A. Borovik, A.
Erko, A. Föhlisch, R.Mitzner, V. K. Yachandra, J. Yano, P. Wernet, U.
Bergmann, Optics Express, (2016), 24(20), 22469-22480
12. Piezoelectric Ca3NbGa3Si2O14 crystal: crystal growth, piezoelectric
and acoustic properties, D. Roshchupkin, L. Ortega, O. Plotitcyna, A.
Erko, I. Zizak, S. Vadilonga, D. Irzhak, E. Emelin, O. Buzanov, W.
Leitenberger, Applied Physics A (2016) 122:753
13. At-wavelength metrology facility for soft X-ray reflection optics,
A. Sokolov, P. Bischoff, F. Eggenstein, A. Erko, A. Gaupp, S. Kuenstner,
M. Mast, J.-S. Schmidt, F. Senf, F. Siewert, T. Zeschke, F. Schäfers,
Review of Scientific Instruments, (2016), 87(5), 052005
14. Structural investigation of supported Cu-n clusters under vacuum and
ambient air conditions using EXAFS spectroscopy, S. Peredkov, S.
Peters, M. Al-Hada, A. Erko, M. Neeb, W. Eberhardt, Catalysis Science
and Technology, (2016), 6(18), 6942-6952
15. Highly efficient blazed grating with multilayer coating for tender
X-ray energies, F. Senf, F. Bijkerk, F. Eggenstein, G. Gwalt, Q. Huang,
R. Kruijs, O. Kutz, S. Lemke, Louis, E.; M. Mertin, I. Packe, I.
Rudolph, F. Schäfers, F. Siewert, A. Sokolov, J. M. Sturm, Ch. Waberski,
Z. Wang, J. Wolf, T. Zeschke, A. Erko, Optics Express (2016) 24(12)
13220-13230
16. Single shot near edge x-ray absorption fine structure spectroscopy
in the laboratory, I. Mantouvalou, K. Witte, W. Martyanov, A. Jonas, D.
Grötzsch, C. Streeck, H. Löchel, I. Rudolph, A. Erko, H. Stiel, B.
Kanngießer Appl. Phys. Lett. 108, (2016) 201106
17. The at-wavelength metrology facility for UV- and XUV-reflection and
diffraction optics at BESSY-II, F. Schäfers, P. Bischoff, F. Eggenstein,
A. Erko, A. Gaupp, S. Künstner, M. Mast, J.-S. Schmidt, F. Senf, F.
Siewert, A. Sokolov and Th. Zeschke, J. Synchrotron Rad. (2016). 23,
67–77
18. Hard x-ray spectroscopy and imaging by a reflection zone plate in
the presence of astigmatism, C. Braig, H. Löchel, A. Firsov, M.
Brzhezinskaya, A. Hafner, J. Rehanek, M. Wojcik, A. Macrander, L.
Assoufid, and A. Erko, Optics Letters , 41(1), (2016), 29-32
2015
19. Reflection zone plate wavelength-dispersive spectrometer for
ultra-light elements measurements, A. Hafner, L. Anklamm, A. Firsov, A.
Firsov, H. Löchel, A. Sokolov, R. Gubzhokov, A. Erko, Optics Express,
23, (23), (2015), 29476
20. Surface acoustic wave propagation in graphene film, D. Roshchupkin,
L. Ortega, I. Zizak, O. Plotitcyna, V. Matveev, O. Kononenko, E. Emelin,
A. Erko, K. Tynyshtykbayev, D. Irzhak and Z. Insepov, J. Appl. Phys.
118, 104901 (2015).
21. Femtosecond high-resolution hard X-ray spectroscopy using reflection
zone plates, H Löchel, C Braig, M Brzhezinskaya, F Siewert, P
Baumgärtel, A Firsov, Optics Express, 23 (7), (2015), 8788-8799
2014
22. Vorteil Multiplex- Spektrometrischer Nachweis von ultraleichten
Elementen, A Erko, A Firsov, A. Hafner, R Gubzhokov, A Bjeoumikhov, A
Günther, N Langhoff, M. Bretschneider, Y. Höhn, R. Wedell, Laborpraxis,
December 2014, 22-24
23. Fabrication of digital rainbow holograms and 3-D imaging using SEM
based e-beam lithography, A Firsov, A Firsov, B Löchel, A Erko, A
Svintsov, S Zaitsev, Optics express 22 (23), (2014), 28756-28770
24. Device and method for determining the energetic composition of
electromagnetic waves, A. Erko, N Langhoff, A Bjeoumikhov US Patent
20,140,314,207
25. FemtoSpeX: a versatile optical pump-soft X-ray probe facility with
100 fs X-ray pulses of variable polarization, K. Holldack, J. Bahrdt, A.
Balzer, U. Bovensiepen, M. Brzhezinskaya, A. Erko, A. Eschenlohr, R.
Follath, A. Firsov, W. Frentrup, L. Le Guyader, T. Kachel, P. Kuske, R.
Mitzner, R. Müller, N. Pontius, T. Quast, I. Radu, J.-S. Schmidt, C.
Schüßler-Langeheine, M. Sperling, C. Stamm, C. Trabant and A. Föhlisch,
J. Synchrotron Rad. (2014). 21, 1090-1104
26. Methods development for diffraction and spectroscopy studies of
metalloenzymes at X-ray free-electron lasers, J Kern, J Hattne, R Tran, R
Alonso-Mori, H Laksmono, S Gul, RG Sierra, J. Rehanek, A. Erko, R.
Mitzner, Ph. Wernet, U. Bergmann, N. K. Sauter, V. Yachandra, J. Yano,
Philosophical Transactions of the Royal Society B: Biological Sciences
(2014), 369, 1647, 20130590.
27. New parallel wavelength-dispersive spectrometer based on scanning
electron microscope A Erko, A Firsov, R Gubzhokov, A Bjeoumikhov, A
Günther, N Langhoff, M. Bretschneider, Y. Höhn, R. Wedell, Optics
Express (2014), 22 (14), 16897-16902
28. Design and optimization of a parallel spectrometer for ultra-fast
X-ray science, C Braig, H Löchel, R Mitzner, W Quevedo, P Loukas, M
Kubin, C Weniger, A. Firsov, J. Rehanek, M. Brzhezinskaya, Ph. Wernet,
A. Föhlisch, A. Erko, Optics Express (2014), 22 (10), 12583-12602
29. Monochromatization of femtosecond XUV light pulses with the use of
reflection zone plates J Metje, M Borgwardt, A Moguilevski, A Kothe, N
Engel, M Wilke, R. Al-Obaidi, D. Tolksdorf, A. Firsov, M. Brzhezinskaya,
A. Erko, I. Yu. Kiyan, and Emad F. Aziz Optics Express (2014), 22 (9),
10747-10760
30. Advanced piezoelectric crystal Ca3TaGa3Si2O14 growth, crystal
structure perfection, and acoustic properties, D. Roshchupkin, L.
Ortega. O. Plotitcyna, ·A. Erko, I. Zizak, D. Irzhak, R. Fahrtdinov, O.
Buzanov, Appl Phys A (2014) 114:1105–1112
31. Structural position and charge state of nickel in SrTiO3 I.A
Sluchinskaya, A.I Lebedev, A. Erko, Physics of the Solid State (2014),
56 (3), 449-455
2013
32. Correlation between structural and opto-electronic characteristics
of crystalline Si microhole arrays for photonic light management, T
Sontheimer, V Preidel, D Lockau, F Back, E Rudigier-Voigt, B Löchel, A.
Erko, F. Schmidt, A. Schnegg, K. Lips, Ch. Becker, B. Rech. Journal of
Applied Physics (2013), 114 (17), 173513
33. Toward sub‐micro‐XRF working at nanometer range using capillary
optics, M Dehlinger, C Fauquet, F Jandard, A Bjeoumikhov, S
Bjeoumikhova, R Gubzhokov, A Erko, I Zizak, D Pailharey, S Ferrero, B
Dahmani, D Tonneau, X‐Ray Spectrometry (2014), 42 (6), 456-461
34. Monochromatizing and focussing femtosecond high-order harmonic
radiation with one optical element, M. Ibek, T. Leitner, A. Erko, A.
Firsov, and P. Wernet , Rev. Sci. Instrum. (2013), 84, 103102,
35. Competition between CoOx and CoPt phases in Pt/Co/AlOx semi tunnel
junctions, H. Garad, L Ortega, A.Y. Ramos, Y Joly, F. Fettar, S.
Auffret, B. Rodmacq, Journal of Applied Physics, (2013) 114 (5), 053508
36. Structural position and oxidation state of nickel in SrTiO3 I.A.
Sluchinskaya, A.I. Lebedev, A. Erko, Journal of Advanced Dielectrics
(2013), 3 (04)
37. L‑Edge X‑ray Absorption Spectroscopy of Dilute Systems Relevant to
Metalloproteins Using an X‑ray Free-Electron Laser R. Mitzner, J.
Rehanek, J. Kern, S. Gul, J. Hattne, T. Taguchi, R. Alonso-Mori, R.
Tran, Ch. Weniger, H. Schröder, W. Quevedo, H. Laksmono, R. G. Sierra,
G. Han, B. Lassalle-Kaiser, S. Koroidov, K. Kubicek, S. Schreck, K.
Kunnus, M. Brzhezinskaya, A. Firsov, M. P. Minitti, J. J. Turner, S.
Moeller, N. K. Sauter, M. J. Bogan, D. Nordlund, W. F. Schlotter, J.
Messinger, A. Borovik, S. Techert, F. M. F. de Groot, A. Föhlisch, A.
Erko, U. Bergmann, V. K. Yachandra, Ph. Wernet, J. Yano, J. Phys. Chem.
Lett. (2013), 4, 3641−3647
38. Structural motifs of pre-nucleation clusters Y. Zhang, I. R.
Türkmen, B. Wassermann, A. Erko, and E. Rühl, J. Chem. Phys. (2013),
139, 134506
39. Studying acoustic-wave fields in langasite-family crystals using the
BESSY II synchrotron radiation source. D.V. Roshchupkin, O.A.
Plotitsyna, R.R. Fakhrtdinov, D.V. Irzhak, A.I. Erko, Journal of Surface
Investigation. X-ray, Synchrotron and Neutron Techniques .(2013), 7 4,
659-662..
40. X-ray diffraction study of surface acoustic waves and pseudo-surface
acoustic waves propagation in La3Ga5.5Ta0.5O14 crystal, D. Roshchupkin,
L. Ortega, O. Plotitcyna, A. Erko, I. Zizak, D. Irzhak, J. Appl. Phys.
113, (2013), 144909
41. A reflectometer for at-wavelength characterization of gratings, F.
Eggenstein, F. Schäfers A. Erko, R. Follath, A. Gaupp, B. Löchel, F.
Senf, T. Zeschke Nuclear Instruments and Methods in Physics Research A
710 (2013) 166–171
42. A novel monochromator for experiments with ultrashort X-ray pulses,
M. Brzhezinskaya, A. Firsov, K. Holldack, T. Kachel, R. Mitzner, N.
Pontius, J.-S. Schmidt, M. Sperling, C. Stamm, A. Föhlisch, A. Erko J.
Synchrotron Rad. (2013). 20, 522-530
43. The confocal plane grating spectrometer at BESSY II, R. Könnecke, R.
Follath, R. Pontius, N. Schlappa, J. Eggenstein, F. Zeschke, T.
Bischoff, P. J.-S. Schmidt, T. Noll, C. Trabant, S. Schreck, Ph. Wernet,
S. Eisebitt, F. Senf, C. Schüßler-Langeheine, A. Erko, Föhlisch, A.,
Journal of Electron Spectroscopy and Related Phenomena, (2013), 188,
p.133-139
44. Structural analysis of colloidal MnOx composites, F Polzer, E
Holub-Krappe, H Rossner, A Erko, H Kirmse, F Plamper, A. Schmalz, A.
Müller, M. Ballauff Colloid and Polymer Science, (2013), 291 (3),
469-481
2012
45. Local structure and site substitution in Al86Ni6Co2Y4.5La1.5 bulk
amorphous alloy Y. Liu, G. Schumacher, I. Zizak, A. Erko, J. Banhart,
Materials Letters, 70, 1 (2012), 171-173
46. Novel parallel vacuum ultra-violet/X-ray fluorescence spectrometer,
A. Erko, A. Firsov, F. Senf, Spectrochimica Acta Part 2012, B 67, 57–63
47. XAFS studies of the local structure and charge state of the Pr
impurity in SrTiO3, I. A. Sluchinskaya, A. I. Lebedev, A. Erko, Physics
of the Solid State, (2012), 54(5), 975-979.
48. Thermal decomposition and fractal properties of sputter-deposited
platinum oxide thin films, A. Mosquera, D.Horwat, L. Vazquez, A.
Gutierrez, A. Erko, A. Anders, J. Andersson, J. L. Endrino, Journal of
Materials Research, (2012), 27(5), 829-836
49. Feasibility of simultaneous surface topography and XRF mapping using
Shear Force Microscopy, M. Dehlinger, C. Dorczynski, C. Fauquet, F.
Jandard, D. Tonneau, A. Bjeoumikhov, S. Bjeoumikhova, R. Gubzhokov, A.
Erko, I. Zizak, D. Pailharey, S. Ferrero, B. Dahmani, International
Journal of Nanotechnology, (2012), 9(3-7), 460-470
2011
50. Thermal decomposition and fractal properties of sputter-deposited
platinum oxide thin films A. Mosquera, D. Horwat, L. Vazquez, A.
Gutiérrez, A. Erko, A. Anders, J. Andersson, J.L. Endrino. J. Mater.
Res., 27, No. 5, (2012), 829-836
51. Combining scanning probe microscopy and X-ray spectroscopy, C.
Fauquet, M. Dehlinger, F. Jandard, S. Ferrero, D. Pailharey, S.
Larcheri, R. Graziola, J. Purans, A. Bjeoumikhov, A. Erko, I. Zizak, B.
Dahmani, D. Tonneau, Nanoscale Research Letters, 6, 308, 2011.
52. Investigation of the thermal diffusion during the formation of a
quasicrystalline phase in thin Al-Pd-Re films, A. Y. Seregin, I. A.
Makhotkin, S. N. Yakunin, A. I. Erko, E. Y. Tereshchenko, D. S.Shaitura,
E. A. Chikina, M. B.Tsetlin, M. N.Mikheeva, E. D. Ol’shanskii,
Crystallography Reports, 2011, 56(3), 497-501
2010
53. Application of Conventional and Microbeam Synchrotron Radiation
X-Ray Fluorescence and Absorption for the Characterization of Human
Nails, M. Katsikini, A. Mavromati, F. Pinakidou, E. C. Paloura, D.
Gioulekas, D. Ioannides, A. Erko, I. Zizak, Journal of Nanoscience and
Nanotechnology, 10, 2010, 6266–6275
54. Linearly graded GeSi beam-expanding/compressing X-ray monochromator,
D. Koryt´ar, C. Ferrari, P. Mikulık, P. Vagovic, E. Dobrocka, V. Ac, P.
Konopka, A. Erko and N. Abrosimov, Journal of Applied Crystallography
(2010). 43, 176–178
2009
55. Review Article Hard X-ray Micro-spectroscopy at Berliner
Elektronenspeicherring für Synchrotronstrahlung II, A. Erko, I. Zizak,
Spectrochimica Acta, Part B, 64, (2009) 833–848
56. Origin of the reduced exchange bias in an epitaxial
FeNi(111)/CoO(111) bilayer, F. Radu, S. K. Mishra, I. Zizak, A. I. Erko,
H. A. Dürr, and W. Eberhardt G. Nowak, S. Buschhorn, H. Zabel, K.
Zhernenkov, M. Wolff, D. Schmitz, E. Schierle, E. Dudzik, R. Feyerherm,
Phys. Rev. B 79, 184425 (2009)
57. X-ray standing wave studies of metal ions incorporation in
Langmuir-Blodgett films N.N. Novikova, S. I. Zheludeva, N. D. Stepina,
A. L. Tolstikhina, R. V. Gainutdinov, W. Haase, A. I. Erko, A.A.
Knyasev, Yu. G. Galyametdinov, Applied Physics A 94, (2009), 461-466,
DOI 10.1007/s00339-008-4971-7
58. X-ray diffraction analysis of the surface acoustic wave propagation
in Langatate crystal”, D.V. Roshchupkin, A I Erko, L Ortega, D V Irzhak,
Appl. Phys. A (2009) 94: 477–484, DOI 10.1007/s00339-008-4932-1
59. Synchrotron microscopy and spectroscopy for analysis of crystal
defects in silicon, W. Seifert, O. F. Vyvenko, T. Arguirov, A. Erko, M.
Kittler, C. Rudolf, M. Salome, M. Trushin, I. Zizak, Phys. Status Solidi
C 6, No. 3, 765– 771 (2009) / DOI 10.1002/pssc. 200880717
60. Direct evidence for off-centering of Mn impurity in SrTiO3, A. I.
Lebedev, I. A. Sluchinskaya, A. Erko, V. F. Kozlovskii, Jetp Letters,
(2009), 89/9, 457-460.
61. XAFS studies of the local environment of Pb impurity atoms in
barium, strontium, and calcium titanates, A. I. Lebedev, I. A.
Sluchinskaya, A. Erko, A. A. Veligzhanin, A. A. Chernyshov, Physics of
the Solid State, (2009), 51/5, 991-997
62. Nanoresolution interface studies in thin films by synchrotron x-ray
diffraction and by using x-ray waveguide structure, Z. Erdelyi, C.
Cserhati, A. Csik, L. Daroczi, G. A. Langer, Z. Balogh, M. Varga, D. L.
Beke, I. Zizak and A. Erko, X-Ray Spectrometry, 38, (2009), 338–342
63. Combined XBIC/μ-XRF/μ-XAS/DLTS, investigation of chemical character
and electrical properties of Cu and Ni precipitates in silicon, M.
Trushin, O. Vyvenko, W. Seifert, M. Kittler, I. Zizak, A. Erko, M.
Seibt, C. Rudolf, Phys. Status Solidi C 6, No. 8, (2009), 1868– 1873
2008
64. Capillary μFocus X-ray lenses with parabolic and elliptic profile,
A. Bjeoumikhov, M. Erko, S. Bjeoumikhovab, A. Erko,_, I. Snigireva, A.
Snigirev, T. Wolff, I. Mantouvalou, W. Malzer, B. Kanngießer, Nuclear
Instruments and Methods in Physics Research A587, (2008), 458–463
65. Depth resolved structural study of heavy ion induced phase formation
in Si/Fe/Si trilayer, P. Rajput, A. Gupta, C. Meneghini, D. K. Avasthi,
N. Darowski, I. Zizak, A. Erko, Hyperfine Interact (2008) 185:9–15 DOI
10.1007/s10751-008-9804-8
66. Transmissive x-ray beam position monitors with submicron position-
and submillisecond time resolution, M. R. Fuchs, K. Holldack, M.
Bullough, S. Walsh, C. Wilburn, A. Erko, F. Schäfers, U. Mueller, Review
of Scientific Instruments, (2008), 79, 063103_2008_
doi:10.1063/1.2938400
2007
67. Sabmicromter hard X-Ray focusing using a single-bounce ellipsoidal
capillary combined with a Fresnel zone plate, A. Snigirev, A.
Bejeoumikhov, A. Erko, I. Snigireva, M. Grigoriev, M. Erko, S.
Bejeoumikhova, Journal of Synchrotron Radiation, (2007), 14, 227-228
68. A new experimental station for simultaneous X-ray microbeam scanning
for small- and wide-angle scattering and fluorescence at BESSY II, O.
Paris, Chenghao Li, S. Siegel, G. Weseloh, F. Emmerling, H. Riesemeier,
A. Erko P. Fratzl, J. Applied Crystallography, (2007). 40, 466–470
69. Two-step hard X-ray focusing combining Fresnel zone plate and
single-bounce ellipsoidal capillary, A. Snigirev, A. Bjeoumikhov, A.
Erko, I. Snigireva, M. Grigoriev, V. Yunkin, M. Erko, S. Bjeoumikhova J.
Synchrotron Rad. (2007). 14, 326–330
70. On the local coordination of Fe in Fe2O3-glass and Fe2O3-glass
ceramic systems containing Pb, Na and Si. F. Pinakidou, M. Katsikini,
E.C. Paloura, O. Kalogirou, A. Erko, Journal of Non-Crystalline Solids,
353, (2007), 2717–2733
71. X-ray Measurements with Micro and Nano-Resolution at BESSY, A.
Gupta, N. Darowsky, I. Zizak, C. Meneghini, G. Schumaher, A. Erko,
Spectrochimica Acta, Part B, 62, (2007), 622-625
72. High Resolution Diffraction X-ray Optics, A. Erko, A. Firsov, Optics and Precision Engineering, 15, No12, (2007), 1816-1822
73. On the distribution and bonding enviromrnt of Zn and Fe in Glasses
contaning electric furnace dust: a μ-XAFS and μ-XRF, F. Pinakidou, M.
Katsikini, E. C. Paloura, P. Kavouras, Th. Kehagias, Ph. Komninou, Th.
Karakostas, A. Erko, Journal of Hazardous Materials, 142 (2007) 297–304
2006
74. Arrangement of trace metal contaminations in thin films of liquid
crystals studied by X-ray standing wave technique, N.N. Novikova, S.I.
Zheludeva, N.D. Stepina, W. Haase, A.I. Erko, A.A. Knyazev, Yu.G.
Galyametdinov, Spectrochimica Acta Part B 61 (2006) 1229–1235
75. Structural Localization of Trace Amounts of Impurity Ionsin
Langmuir–Blodgett Films by the X-ray Standing Wave Method, N. N.
Novikova, S. I. Zheludeva, N. D. Stepina, A. L. Tolstikhina, R. V.
Ganutdinov, A. I. Erko, W. Haase, and Yu. G. Galyametdinov,
Crystallography Reports, (2006),, 51, No. 6, 1041–1047
76. New insights into the colour origin of archaeological Egyptian Blue
and Green by XAFS at the Cu K edge, S. Pagès-Camagna, I. Reiche, Ch.
Brouder, D. Cabaret, S. Rossano, B. Kanngießer, A. Erko, X-Ray
Spectrometry (2006), 35, 141-145
77. Application of μ-XAFS for the determination of the crystallization
ratio in a series of vitro-ceramic materials containing industrial
waste, F. Pinakidou, M. Katsikini, E. C. Paloura, P. Kavouras, Ph.
Komninou, Th. Karakostas, A. Erko, Nuclear Instruments and Methods in
Physics Research, B246 (2006) 238–243
78. On the coordination environment of Fe- and Pb-rich solidified
industrial waste: an X-Ray absorption and Mössbauer study, F. Pinakidou,
M. Katsikini, E. C. Paloura, P. Kavouras, Ph. Komninou, Th. Karakostas,
A. Erko, Journal of Non-Crystalline Solids, 352 (2006) 2933–2942
2005
79. Nanometer focusing of x-rays with modified reflection zone plates,
A.G. Michette, S.J. Pfauntsch, A. Erko, A. Firsov, A. Svintsov, Optics
Communications, 245, (2005), 249–253.
80. XAFS studies on vitrified industrial waste, F. Pinakidou, M.
Katsikini, E. C. Paloura, P. Kavouras, Ph. Komninou, Th. Karakostas, A.
Erko, Physica Scripta. Vol. T115, (2005), 931–932,
81. Study of annealing induced devitrification of stabilized industrial
waste glasses by means of micro x-ray fluorescence mapping and
absorption fine structure spectroscopy, F. Pinakidou, M. Katsikini, E.
C. Paloura, P. Kavouras, Ph. Komninou, Th. Karakostas, A. Erko, Journal
of Non-Crystalline Solids 351 (2005) 2474–2480
82. Исследование белково-липидных мембранных моделей с помощью
рентгенофлуоресцентных методик, Н.Н. Новикова, Э. А. Юрьева, С.И.
Желудева, М.В. Ковальчук, Н.Д. Степина, О.В. Коновалов, А.Л. Толстихина,
Р.В. Гайнутдинов, Д.В. Урусова, Т.А. Матковская, А.М. Рубцов, О.Д.
Лопина, А.И. Ерко, Поверхность. Рентгеновские, синхротронные и
нейтронные исследования, (2005), № 8, с. 67-73.
83. X-ray fluorescence methods for investigations of lipid/protein
membrane models, N. N. Novikova, E. A. Yurieva, S. I. Zheludeva, M.
V.Kovalchuk, N. D. Stepina, A. L. Tolstikhina, R. V. Gaynutdinov, D. V.
Urusova, T. A. Matkovskaya, A. M. Rubtsov, O. D. Lopina, A. I. Erko and
O. V. Konovalov, Journal of Synchrotron Radiation, (2005). 12, 511–516
2004
84. The BESSY X-Ray Microfocus Beamline project, A. Erko, F. Schäfers,
A. Firsov, W.B. Peatman, W. Eberhardt, R. Signorado, Spectrochimica
Acta, 2004, Part B 59, 1543-1548
85. Investigation of Oxidation and Migration Processes of Inorganic
Compounds in Ink Corroded Manuscripts, B. Kanngießer, O. Hahn, M. Wilke,
B. Nekat, W. Malzer, A. Erko, Spectrochimica Acta A, 2004, Part B 59,
1511-1516
86. Micro-X-Ray absorption near edge structure spectroscopy
investigations of baroque tin-amalgam mirrors at BESSY using a capillary
focusing system, J. Bartoll, S. Röhrs, A. Erko, A. Firsov, A.
Bjeoumikhov, N. Langhoff, Spectrochimica Acta A, 2004, Part B 59,
1587-1592
2003
87. Combined molecular beam epitaxy and diffractometer system for in
situ x-ray studies of crystal growth, B. Jenichen, W. Braun, V. M.
Kaganer, A. G. Shtukenberg, L. Däweritz, C.-G. Schulz, K. H. Ploog, A.
Erko, Review of Scientific Instruments, (2003), 74(3), 1267-1273
88. Possibilities of X-ray Fluorescence in the Region of Total External
Reflection for Studying Langmuir Monolayers on the Surface of a Liquid
and Solid Substrate, S. I. Zheludeva , N. N. Novikova, O. V. Konovalov,
M. V. Kovalchuk , N. D. Stepina , E. A. Yur’eva, I. V. Myagkov , Yu. K.
Godovski , N. N. Makarova , A. M. Rubtsov, O. D. Lopina , A. I. Erko, A.
L. Tolstikhina , R. V. Gainutdinov , V. V. Lider , E. Yu. Tereshchenko,
and L. G. Yanusova, Crystallography Reports (2003), Vol. 48, Suppl. 1,
25
2002
89. The first synthetic X-ray hologram: results, A. Firsov, A. Svintsov,
S.I. Zaitsev, A. Erko, V. Aristov, Optics Communications, (2002), 202,
55–59
90. Laterally-Graded SiGe Crystals for High Resolution Synchrotron
Optics, A. Erko, N. V. Abrosimov, V. Alex, Cryst. Res. Technol., (2002),
37, Nr.7, 685–704
2001
91. Crystal-based diffraction Focusing Elements for Third-Generation
Synchrotron Radiation Sources, A. Firsov, A. Svintsov, A. Erko, W.
Gudat, S. Kuznetsov, M. Grigoriev, A. Asryan, M. Ferstl, S. Shapoval, V.
Aristov, Nuclear Instruments and Methods in Physics Research, (2001),
A467–A468, 366–369
92. High-Order Harmonic Suppression by a Glass Capillary Array, A. Erko,
N. Langhoff, A.A.Bjeoumikhov, V.I. Beloglasov, Nuclear Instruments and
Methods in Physics Research, (2001), A 467–468, 832–835
93. The Crystal Monochromator Based on graded SiGe Crystals, A. Erko, I.
Packe, W. Gudat, N. Abrosimov, A. Firsov, Nuclear Instruments and
Methods in Physics Research, (2001), A467–468,. 358–361
94. Graded SiGe Crystals as X-Ray Collimators, P. Petrashen, A. Erko,
Nuclear Instruments and Methods in Physics Research, (2001), A 467–468,
358–361
1999
95. Многослойные регистраторы пучков Брэгга-Френеля BESSY, А. Ерко, К.
Холлдак, В. В. Питмaн, Т. Нолл, В. В. Аристов, А. Якшин. Л. Панченко, А.
Коваль, В. Данилов, Поверхность. Рентгеновские, синхротронные и
нейтронные исследования, (1999), N1, 170-174.
96. Градиентные кристаллы SiGe для монохроматизации синхротронного
излучения, Е. В. Шулаков, В. Ш. Шехтман. С. С. Хасанов, И. А. Смирнова,
А. И. Ерко, М. Фелъдкамп, Ф. Алекс, Н. В. Абросимов. С. Н. Россоленко,
Поверхность. Рентгеновские, синхротронные и нейтронные исследования,
(1999), N1, 92-97
97. Si1-xGex laterally graded crystals as monochromators for x-ray
absorption spectroscopy studies, M. Veldkamp, A. Erko, W. Gudat, N. V.
Abrosimov, V. Alex, S. Khasanov, V. Shekhtman, F. Neissendorfer, U.
Pietsch, Jpn. J. Appl. Phys. Suppl. (1999), 38-1, 612-615
1998
98. Fixed Exit Double Crystal Monochromator with one single cooled
crystal A. Souvorov, M. Drakopoulos, A. Freund, I. Snigireva, A.
Snigirev, A. Erko, W. Gudat, N. Abrosomov, S Rossolenko, W. Schröder,
Nuclear Instruments and Methods in Physics Research, (1998), A413,
427-430
99. Graded X-Ray Optics for Synchrotron Radiation Applications, Erko, M.
Veldkamp, W. Gudat, N.V. Abrosimov, S.N. Rossolenko, V.Shekhtman, S.
Khasanov, V. Alex, S. Groth, W. Schröder, B. Vidal, A. Yakshin, Journal
of Synchrotron Radiation, (1998), 5, 239-245
1997
100. Synchrotron radiation beam splitting and filtering by a
polycapillary array, V. Arkadiev, A. Bjeumikhov, A. Erko, F. Schafers,
P. Chevallier, P. Populus, Nuclear Instruments and Methods in Physics
Research A384, (1997), 547-551
1996
101. On the Feasibility of Employing Gradient Crystals for High
Resolution Synchrotron Optics, A. Erko, F. Schäfers, W. Gudat, N.V.
Abrosimov, S.N. Rossolenko, W. Alex, S. Groth, W. Schröder Nuclear
Instruments and Methods in Physics Research, (1996), A374 408-412
102. The LURE-IMT X-Ray Fluorescence Photon Microprobe, P. Chevallier,
P. Dhez, F. Legrand, A. Erko, Yu. Agafonov, L.A. Panchenko, A. Yakshin,
J. Trace and Microprobe Techniques, (1996), 14 Nr.3, 517-539
103. X-Ray Microprobes, P. Chevallier, P. Dhez, A. Erko, A. Firsov, F.
Legrand, P. Populus, Nuclear Instruments and Methods in Physics
Research,, (1996), B113, 122-127
104. BESSY Bragg-Fresnel multilayer beam monitor, K. Holldack, A. Erko, W.B. Peatman, Rev. Sci. Instrum. (1996), 67, 3367
1995
105. X-ray Supermirrors for BESSY II, A. Erko, F. Schäfers, B. Vidal, A.
Yakshin, U. Pietsch, W. Mahler, Review Scientific Instruments, (1995),
66, Nr.10, , 4845-4846
106. A Bragg-Fresnel Multilayer Beam Monitor for Third Generation
Storage Rings, K .Holldack, A.I. Erko, T.Noll, W.B. Peatman, Nuclear
Instruments and Methods in Physics Research 1995, A365, 40-45
107. Fabrication, structure and reflectivity of W/C and W/B4C
multilayers for X-ray optics, E. Yakshin, I. I. Khodos, I. M Zhelezniak
and A. I. Erko, Optics Communication 1995, 118, 133-142
108. First Test of the scanning X-Ray microprobe with Bragg-Fresnel
multilayer lens at ESRF beamline P.Chevallier P.Dhez, F.Legrand, M.Idir,
G.Soullié, A.Mirone, A.Erko, A.Snigirev, I.Snigireva, A.Suvorov,
A.Freund, P.Engstroem, J. Als Nielsen, G.Grübel, Nuclear Instruments and
Methods in Physics Research, 1995, A354, 584-587
109. Microplasma object imaging spectroscopy by using zone plate surface
structure on mica crystal, Erko, L. A. Panchenko, S. A. Pikuz, A. R.
Mingaleev, V. M. Romanova, T. A. Shelkovenko, A. Ya. Faenov, B. A.
Bryunetkin, T. A. Pikuz, and I. Yu. Skobelev, Rev. Sci. Instrum. 66,
1047 (1995)
1994
110. Elliptical Multilayer Bragg-Fresnel Lenses with Submicron Spatial
Resolution, A. Erko, Yu. Agafonov, L.A. Panchenko, A. Yuakshin, P.
Chevallier, P. Dhez, F. Legrand, Optics Communications, 1994, 106,
146-150
111. Dinamical Theory for Bragg-Fresnel Multilayer Lenses for X-UV and
X-Ray Range, A. Mirone, M. Idir, P. Dhez, G. Soullie, A.I. Erko, Optics
Communications, 1994, 111, 191-198
112. Multilayer Bragg-Fresnel Optics: Design, Technology and Applications, A. Erko, Journal de Physique IV, 1994, C9, 4, 245-251
113. Comparison of Modal and Differential Method for Multilayer
Gratings, M. Brunel, A. I. Erko, V. V. Martynov, B. Vidal, P. Vincent,
A. Yuakshin, D. V. Roshchoupkin, Nuclear Instruments and Methods in
Physics Research, 1994, A339, 617-625
114. Multilayer Diffraction Grating Properties, A. Erko, V.V. Martynov,
D.V.Roshchupkin, A.Yuakshin, B.Vidal, P.Vincent, M.Brunel, Journal de
Physique III, France, 1994, 4, 1649-1658
115. High-Performance X-Ray Spectroscopic Devices for Plasma
Micro-sources Investigations Ya. Faenov, S.A. Pikuz, A.I. Erko, B.A.
Bryunetkin, V.M. Dyakin, G.V. Ivanenkov, A.R. Mingaleev, T.A. Pikuz,
V.M. Romanova, T.A. Shelkovenko, Physica Scripta, 1994, 50, 333-338
1993
116. Multilayer Gratings Efficiency: Nomerical and Physical Experiment,
A. Erko, B.Vidal, P.Vincent, Yu. Agafonov, V.V. Martynov,
D.V.Roshchupkin, M.Brunel, Nuclear Instruments and Methods in Physics
Research, 1993, A333, 599-606
117. Imaging spectroscopy of microscopic plasmas by means of a mica
crystal with a zone-plate surface structure, Yu. A. Agafonov, B. A.
Bryunetkin, A. I. Erko, A. R. Mingaleev, S. A. Pikuz, V. T. Romanova, I.
Yu. Skobelev, A. Ya. Faenov, and T. A. Shelkovenko, Quantum Electron.
1993, 23, 172
1992
118. Dynamic X-ray diffraction by a multilayer mirror modulated with a
transverse acoustic wave, V.V. Aristov, A.I. Erko, V.V. Martynov,
Journal of X-ray Science and Technology, 1992, Nr.3, 211-221
119. Obtaining the image of the „hot point“ of a fast Z pinch by means
of a linear Bragg–Fresnel lens, Yu. A. Agafonov, B. A. Bryunetkin, A. I.
Erko, A. P. Mingaliev, S. A. Pikuz, V. M. Romanova, I. Yu. Skobelev, A.
Ya. Faenov, and T. A. Shelkovenko, Sov. Tech. Phys. Lett. 1992, 18, 533
120. Proxy – a New Approach for Proximity Correction in Electron Beam
Lithography, V.V. Aristov, A.I.Erko, B.N.Gaifullin, A.A.Svintsov,
S.I.Zaitsev, R.R.Jede, H.F.Raith, Microelectronic Engineering, 1992, 17,
413-416
121. X-ray Space Modulation by Diffraction on an Ultrasonic
Superlattice, D.V. Roshchupkin, M. Brunel, F. de Bergevin, A.I. Erko,
Nuclear Instruments and Methods in Physics Research, 1992, B72, 471-476
122. Kirpatrick-Baez Microscope Based on Bragg-Fresnel X-Ray Multilayer
Lenses, P. Dhez, A.I. Erko, E. Khzmalian, B. Vidal, Appl. Optics,1992,
31, 6664-6668
1991
123. New materials for optical computing and holography, R. V. Ryabova,
V. V. Ammosov, E. A. Arestova, S. G. Averyanov, V. L. Baranoy, Y. A.
Bykovsky, A. I. Erko, L. G. Gnatyuk, M. H. Grosmann, M. L. Gurary, Yu.
K. Kovneristy, A. I. Larkin, Yu. A. Mironov, O. V. Morgunov, A. V.
Shelyakov, S. Wang and A. M. Zarubin, Material Science and Engineering
B, 1991, 9(4), 463-467
124. Fabrication and Test of Multilayer Bragg-Fresnel Lenses, A.I. Erko,
L.A. Panchenko, A.A. Firsov, V.I. Zinenko, Microelectronic Engineering,
1991, 13, 335-338
1990
125. Synthesized Bragg-Fresnel Multilayer Optics, A.I. Erko, Journal of X-Ray Science and Technology, 1990, 2, 297-316
126. Focusing properties of ellipsoidal Bragg-Fresnel multilayer lenses,
A.I. Erko, A. A. Firsov, N. N. Salashchenko, Yu. Ya. Platonov, A. V.
Zabelin, V. B. Rybakov, and E. P. Stepanov, Sov. Tech. Phys. Lett. 1990,
16, 38
1989
127. Multilayer Structure Modulated by Surface Acoustic Waves, G.V.
Vereschagin, A.I. Erko, D.V. Roschupkin, A.M. Smolovich, Nuclear
Instruments and Methods in Physics Research, 1989, A282, 634-637.
128. Fabrication of diffraction X-Ray Elements, S.V. Babin, A.I. Erko,
Nuclear Instruments and Methods in Physics Research, 1989, A282,
529-531.
129. Synthesized Multilayer Fresnel X-Ray Optics, A.I. Erko, Review Scientific Instruments, 1989, 60, Nr,7, P28, 2502-2505.
1988
130. Principles of Bragg-Fresnel Multilayer Optics, V.V. Aristov, A.I.
Erko, V.V. Martynov, Revue Phys. Appl., 1988, 23, Nr.5. 1623-1630.
131. Charging mechanism for the formation of a metastable
surface-acoustic-wave potential contrast observed in a scanning electron
microscope, N. N. Dremova, A. I. Erko, and D. V. Roshchupkin, Sov.
Phys. Tech. Phys. 1988, 33, 1066
132. Optics and Spectroscopy on the Base of Talbot Effect, Sov. Journ.
of Optics and Spectroscopy, V.V. Aristov, Erko A.I., Martynov V.V.,
1988, 64, 630-637 (in Russian)
133. Fabrication of Presize Zone-Plates by E-Beam Lithography, S.V.
Babin, A.V. Davydov, A.I. Erko, A.A. Svintsov, Surface: Physics,
Chemistry, Mechanics, 1988, Nr.4, 79-82. (in Russian)
134. Plane Optics for Optical Lithography, G.A. Bashkina, S.V. Babin,
A.V. Davydov, A.I.Erko, V.V. Martynov, Microelectronics, 1988, 17, P2,
184-186.
1987
135. Wave-front reconstruction using intensity distribution, V. V.
Aristov, A. I. Erko, Ch. V. Kopetskii, S. M. Kuznetsov, and N. G.
Ushakov, Sov. Journ. of Optics and Spectroscopy, 1987, 62, 653
136. Fresnel optics for the nanometer range, made with silicon single
crystals, A.V. Davydov, A.I. Erko, L.A. Panchenko, S.V. Pedkin, G.D.
Sazonova, V.A.Yunkin, Sov. Tech. Phys. Lett, 1987. 13, 424
137. Precise Lithography for Component Integral Optics of Nanometer
Range, V.V. Aristov, S.V. Babin, A.V. Davydov, A.I. Erko, A.A. Svintsov,
S.V. Redkin, Microelectronic Engineering. 1987, 6, 129-134.
138. Observation of x-ray diffraction by a multilayer structure
modulated by an acoustic wave, V.V. Aristov, G.V. Vereschagin, A.I.
Erko, L.A. Matveeva, D.V. Roschupkin, Sov. Tech. Phys. Lett. 1987, 13,
538
139. Research complex for electron-beam lithography, S.V. Babin, A.V.
Davydov, A.I. Erko, Instrum. Exp. Tech. (Engl. Transl.); (United
States); Journal Volume: 30:2; Translated from Prib. Tekh. Eksp.; 30:
No. 2, 191-196 (Mar-Apr 1987)
1986
140. Focusing Properties of Shaped Multilayer Mirrors, V.V. Aristov,
S.V. Gaponov , V.M. Genkin, Yu.A. Gorbatov, A.I. Erko, V.V. Martynov,
L.A. Matveeva, N.N. Salashenko, A.A. Fraerman, JETP Lett. 1986, 44(4),
265-266
141. Observation of X-Ray Bragg Diffraction on the Periodic Surface
Relief of a Perfect Silicon Crystal, V.V. Aristov, A.I. Erko, A.A.
Snigirev, A.N. Nikulin, Optical Communications, 1986, 58, Nr.5, 300-302.
1985
142. Observation of Fourier Images in Soft X-Ray Radiation, V.V.
Aristov, S. Aoki, A.I. Erko, S. Kikuta, V.V. Martynov, Optics
Communications, 1985, 56, Nr.4, 223-255.
143. Prospects of High Resolution X-Ray Lithography, V.V. Aristov A.I.
Erko V.A. Kudriashov, Microelectronic Engineering, 1985, 3, 589-595
144. Projection Image Transmission of Periodic Structures in Spatially
Incoherent Radiation, V.V.Aristov, A.I.Erko, V.V. Martinov, Optics
Communications, 1985, 53, Nr.3, 159-163.
1984
145. Device Fabrication by Nanolithography and Electroplating for
Magnetic Flux Quantization Measurements, E. Kratchmer, H. Beneking, A.I.
Erko, V.T. Petrashov, Appl. Phys. Lett., 1984, 44, (10), 1011-1013.
1983
146. Projection X-ray Lithography of Periodical Structure, V.V. Aristov
G.A. Bashkina, L.V.Dorozkhina, A.I. Erko, V.V. Martynov, Surface:
Physics, Chemistry and Mechanics, 1983, Nr.12, 113-118. (in Russian)
1982
147. An application of synthetic holograms for an investigation of local
electrical fields by scanning electron microscopy, V.V. Aristov, G.A.
Bashkina, A.I. Erko, Surface: Physics, Chemistry and Mechanics, 1982,
Nr.7, 61-63.
1980
148. Principles of an optical recording on dichromate gelatin layers,
A.I. Erko, A.N. Malov, Fundamental principles of optical memory and
recording materials, Nr.11, Kiev, 1980, 62-63. (in Russian)
149. Modulation transfer function of the dichromate gelatin, A.N. Malov,
A.I. Erko, Fundamental principles of optical memory and recording
materials, Nr.11, Kiev, 1980, 68-72. (in Russian)
150. Optimization of dichromate gelatin development process for an
optical hologram recording, A.N. Malov, A.I. Erko, Sov. Journ.
Scientific and applied photography and cinematography, Nr.3, 1980,
185-187. (in Russian)
151. An application of optical filtration methods to X-ray images
treatment V.V. Aristov, G.A. Bashkina, L.V. Dorogkina, A.I. Erko, in
“Application of optical and holographic methods in information
transfer”, ed. S.B. Gurevich, B.K. Sokolov, Leningrad, 1980, 146-150.
(in Russian)
152. Holography of Microobjects in Soft X-Rays, V.V. Aristov, G.A. Bashkina, A.I. Erko, Opt. Communs. 1980, 34, Nr.3, 332-336.
153. Processing of X-Ray Images by Optical Filtration Methods, V.V.
Aristov, G.A. Bashkina, A.I. Erko, Phys. Stat. Sol.,1980, 59a, 663-671.
1979
154. Semiconductor laser with a holographic selector, Yu. A. Bykovskii,
A. I. Erko, and A. I. Larkin, Sov. J. Quantum Electron. 9, (1979),
231-232
155. Observation of a dip in the spontaneous emission spectrum and a
saturation of generation in single-mode semiconductor lasers, V. F.
Elesin, A. I. Erko, A. I. Larkin, JETP Lett. 29, (1979), 651
PATENTS
1. Device and method for determining the energetic composition of
electromagnetic waves, A. Erko, N Langhoff, A Bjeoumikhov, , A
Bjeoumikhov, US Patent 9,417,341.
2. Device for measuring resonant inelastic x-ray scattering of a sample,
A. Erko, A. Föhlisch, J. K. Rehanek, Ch. Schüssler-Langeheine, EP
2870464 A1, DE102012013530 B3
3. Device for topographical characterisation and chemical mapping of
surfaces D. Tonneau, J. Purans, C. Fauquet, F. Jandard, A. Erko, A.
Bjeoumikhov, EP 2577325 A1
Conference talks and Proceedings
Invited talks
1. A. Erko, Invited speaker, Femtosecond Modular X-ray Spectrometer –
Monochromator, PhotonDiag 2018, International Workshop, DESY, Hamburg,
September 2018
2. A. Erko, Invited speaker, Reflection zone plate wavelength
–dispercive X-ray spectrometry EMAS 2017 15th EUROPEAN WORKSHOP on
MODERN DEVELOPMENTS AND APPLICATIONS IN MICROBEAM ANALYSIS, 7 – 11 May
2017, Konstanz, Germany
3. A. Erko, Invited speaker, 2-Dimensional VLS Gratings for X-ray
Spectroscopy and Monochromators with Femtosecond Time Resolution,
International Conference on X-ray optics and Applications 2017, 18-21
April 2017, Yokohama, Japan
4. A.Erko, Plenary speaker, State-of-the-art X-ray optical systems and
their fabrication, 13th International Conference of the European Society
for Precision Engineering & Nanotechnology, 27-31 May 2013, Berlin,
Germany.
5. A. Erko Invited speaker, 3-D Reflection Zone Plates for X-Ray
Monochromatization and Spectroscopy, SRI 2012, The 17th Pan-American
Synchrotron Radiation Instrumentation Conference June 19-21, 2013 at
NIST, Gaithersburg, MD USA
6. A. Erko Invited speaker, Activities in Europe (SXR), “X-ray Optics
for BES Light Source Facilities”, Basic Energy Sciences Workshop on
X-ray Optics for BES Light Source Facilities Potomac, MD, March 27 – 29,
2013
7. A. Erko, Invited speaker, Novell Röntgenoptische Systeme für
Spektroskopie und Monochromatoren. Prozessnahe Röntgenanalytik PRORA,
22-23 November 2013, Berlin-Adlershof.
8. A. Erko, Invited speaker, Nanometer optics and technology, First
German-Russian conference on knowledge and technology transfer in
science, St. Petersburg State University, Russia, 16-18 December, 2011
9. A. Erko, Invited, Nanometer Optics Technologies at Helmholtz Centre
Berlin. Joint final Conferenceof COST Actions IE0601 and MP0601: Wood
Science for Cultural Heritage, 14-15/11/2011: Short Wavelength
Laboratory Sources, 16-18/11/2011, Paris, France
10. A.- Erko, Member of International Scientific Advisory Boat, “Recent
Developments in FS Soft X-ray Spectroscopy”, E-MRS 2011 Symposia,
Workshop on X-ray Technique for Advanced Materials: Nice, France, 9-14
May 2011
11. A. Erko, N. Langhoff, I. Höhn, M. Haschke, Invited, Novel
Wavelength-Dispersive Parallel X-ray Spectrometer, PRORA, 18-19 November
2011
12. A. Erko, A. Firsov, Invited, Parallel fs spectrometer for soft
x-rays, Workshop on X-ray Optics, Chernogolovka, Russia, 20-24 September
2010
13. A. Erko, Invited speaker, Integration of Diffraction Focussing
Optics into RAY, SMEXOS: Simulation Methods for X-ray Optical Systems,
February 24-25, 2009, Grenoble, France
14. A. Erko, Invited speaker, Hard X-Ray Microspectroscopy at BESSY II,
SPIE Annual meeting Europe, Workshop: Challenge in Optics and
Optoelectronics, Plaque, 23 April 2009, Czech Rep.
15. A. Erko, Invited speaker, X-ray micro/nano metrology at BESSY, 2-d
School on Nanometrology, Chernogolovka, 28-30 May 2009, Russia
16. A. Erko, Invited speaker, member of International Scientific
Advisory Boat, Synthesized X-Ray Holographic Optics, 2-nd School and
Workshop on X-Ray Micro and Nanoprobes (XMNP 2009), June 14-22, 2009,
Italy
17. A. Erko, Invited speaker, A. Firsov, K. Holldack, Ultra-High Time
Resolved XAS, XX Panhellenic Conference on Solid State Physics and
Material Science, Thessaloniki, September 20-23, 2009, Greece
18. A. Erko, Invited speaker, A. Firsov, K. Holldack, New Developments
in Femto-Second Soft X-rays Spectroscopy, SRI-2009, Melbourne, September
26 – Ocrober 2, 2009, Austarlia
19. A. Erko, Invited speaker, Moderne Röngenoptiken für analytische
Anwendungen an Synchrotron-beamlines und Labor, Fachtagung PRORA 2009,
26-27 November 2009, Berlin, Germany
20. A. Erko, Invited speaker, I. Zizak, X-Ray Micro-Spectroscopy at
BESSY II, 54-th DAE Solid State Physics Symposium, MS University Baroda,
Vadodara, December 14-18, 2009, India
21. A. Erko, Member of International Scientific Advisory Boat, A.
Firsov, K. Holldack “RZP monochromator for Femto-second XANES at BESSY
II”, E-MRS 2009 Symposia, Workshop on X-ray Technique for Advanced
Materials: Strasbourg, 8-12 June 2009
22. A. Erko, Invited speaker, Coherent Diffraction Optics for VUV and
X-rays, 404 Wilhelm and Else Heraeus-Seminar “Matter in Coherent Light”,
March 17-20, 2008, Physikzentrum Bad Honnef, Germany
23. A. Erko, Invited, A. Firsov, “High-resolution Diffraction X-Ray
Optics”, Optics and Precision Engineering, Proceedings of the 2007
Sino-German High Level Expert Symposium on X-ray Optics, Shanghai,
Optics and Precision Engineering, 12, (2007), 1816-1822
24. A. Erko, Invited speaker, μXRFA and μEXAFS Measurements of Organic
and Non-Organic Samples, SPIE Annual Meeting, Conf. Instruments, Methods
and Missions for Astrobiology, San-Diego 2006, USA
Conference abstracts (recent)
1. R. Garcia-Diez, R. G. Wilks, S. Hendel, A. Erko, M. Bär,
“Characterization of real-world electro-catalysts under operando
conditions by soft x-ray spectroscopy”, 13th International Conference on
Synchrotron Radiation Instrumentation (SRI 2018), Abstracts, Poster,
119
2. A. Erko A. Hafner, L. Anklamm, An. Firsov, Al. Firsov, H. Löchel, A.
Sokolov, R. Gubzhokov “iZPSSEM: the new spectrometer for ultra-light
elements”, PRORA Tagung, 11-13 November 2015, Berlin-Adlershof, Germany
3. M. Brzhezinskaya, A. Firsov, A. Erko, New Reflection Zone Plate Array
Optics with Individual Depth Profiles for Ultra-fast X-Ray
Applications, Abstract, 12th International conference SRI-2015, New York
City, July 6-10, 2015
4. An. Firsov, Al. Firsov, H. Löchel, J. Probst, P. Loukas, A. Erko,
Abstract, 3-Dimensional profiling for diffraction optical elements,
SPIE, SPIE Optics + Optoelectronics, Prague, Czech Republic 13 – 16
April 2015, 9510-18
5. H. Löchel, Ch. Braig, M. Brzhezinskaya, F. Siewert, P. Baumgärtel, A.
Firsov, and A. Erko Spectroscopy with Reflection Zone Plates, 2nd
German-Swedish Workshop on X-ray Optics, Berlin, 28-30 April 2015
6. A. Hafner, A. Firsov, H. Löchel, J. Probst, A. Firsov and A. Erko
Reflection zone plates for XUV fluorescence spectrometer, 2nd
German-Swedish Workshop on X-ray Optics, Berlin, 28-30 April 2015
7. A. Fernandez‐Herrero, Ch. Braig, H. Löchel, A. Firsov, M.
Brzhezinskaya, and A. Erko Multi‐wavelength reflection zone plate arrays
for wide‐range soft X‐ray spectroscopy, 2nd German-Swedish Workshop on
X-ray Optics, Berlin, 28-30 April 2015
8. F. Senf, F. Bijkerk, F. Eggenstein, A. Erko, G. Gwalt, Q. Huang, R.
Kruijs, O. Kutz, S. Lemke, M. Mertins, I. Packe, I. Rudolph, F.
Schäfers, F. Siewert, A. Sokolov, Ch. Waberski, Z. Wang, J. Wolf, T.
Zeschke, Performance of a blazed multilayer grating for energies between
800 eV and 5000 eV, calculations and measurements, , 2nd German-Swedish
Workshop on X-ray Optics, Berlin, 28-30 April 2015
9. S. Vadilonga, I. Zizak, A. Erko, and D. Roshchupkin, Active X‐ray
Optics, 2nd German-Swedish Workshop on X-ray Optics, Berlin, 28-30 April
2015
10. D. Roshchupkin, L. Ortega, O. Plotitcyna, A. Erko, I. Zizak
Time‐resolved X‐ray optics based on ultrasonic superlattices, 2nd
German-Swedish Workshop on X-ray Optics, Berlin, 28-30 April 2015
11. A.A. Sokolov, F Eggenstein, A Erko, R Follath, S Künstner, M Mast,
JS Schmidt, F Senf, F Siewert, T Zeschke, F Schäfers, An XUV optics
beamline at BESSY II, SPIE Optical Engineering+ Applications, 2014,
92060J-92060J-13
12. A. Erko, Novell 2D-3D optical systems for X-ray spectroscopy,
European Conference on X-Ray Spectrometry (EXRS), Bologna, Italy, June
2014
13. H. Loechel, Ch. Braig, R. Mitzner, W. Quevedo, P. Loukas, M. Kubin,
Ch. Weniger, A. Firsov, J. Rehanek, M. Brzhezinskaya, P. Wernet, A.
Föhlisch, A. Erko, Design of a highly efficient parallel X-ray
spectrometer for low signal analysis, European Conference on X-Ray
Spectrometry (EXRS), Bologna, Italy, June 2014
14. A. Hafner, A. Erko, A. Firsov, R. Gubzhokov, A. Bjeoumikhov, A.
Günther, N. Langhoff, M. Bretschneider, Y. Höhn, R. Wedell, Wavelength –
dispersive spectrometer based on a scanning electron microscope,
European Conference on X-Ray Spectrometry (EXRS), Bologna, Italy, June
2014
15. H. Löchel, J. Probst, C. Braig, P. Loukas, A. Fernandez Herrero, A.
Firsov, A. Erko, Design of reflection zone plates for X-ray spectroscopy
and monochromatization, , Deutsche Tagung für Forschung mit
Synchrotronstrahlung, Neutronen und Ionenstrahlen an Großgeräte. Bonn,
21.-23. September 2014
16. M. Brzhezinskaya, A. Firsov, A. Erko Ultra-high time resolution
optical systems based on diffractive 2D and 3D elements, XRM 2014,
Melbourne, Australia, November 2014
17. A. Firsov, A. Erko, Total external reflection three-dimensional
X-ray diffraction optical elements for high harmonic generators and free
electron lasers experiments, Deutsche Tagung für Forschung mit
Synchrotronstrahlung, Neutronen und Ionenstrahlen an Großgeräte. Bonn,
21.-23. September 2014
18. A. Erko, Novell 2D-3D optical systems for X-ray monochromators and
spectroscopy with accelerator driven photon sources Deutsche Tagung für
Forschung mit Synchrotronstrahlung, Neutronen und Ionenstrahlen an
Großgeräte. Bonn, 21.-23. September 2014
19. A. Fernandez Herrero, H. Löchel, C. Braig, A. Firsov, F. Senf, M.
Brzhezinskaya, and A. Erko High-resolution Parallel Soft X-ray
Spectroscopy with a Single Optical Element, Deutsche Tagung für
Forschung mit Synchrotronstrahlung, Neutronen und Ionenstrahlen an
Großgeräte. Bonn, 21.-23. September 2014
20. M. Brzhezinskaya, A Firsov, A Erko, Diffractive 3D XUV optics at
Helmholtz-Zentrum Berlin, recent developments, M SPIE Optical
Engineering+ Applications, (2014), 92070C-92070C-6
21. A. Firsov, A Svintsov, A Erko, Diffractive focusing optics design at
Helmholtz-Zentrum Berlin, A Firsov, M Brzhezinskaya, A SPIE Optical
Engineering Applications, (2014), 920712-920712-6
Conference proceedings
1. Survey and Adjustment Methods Applied on an 11 Axes High Performance
Reflectometer for Synchrotron Radiation, F. Eggenstein, P. Bischoff, F.
Schaefers, T. Schroeter, F. Senf, A. Sokolov, T. Zeschke, A. Erko, A.)
AIP Conference Proceedings, (2016);1741, 030025
2. RAY-UI: A Powerful and Extensible User Interface for RAY, P.
Baumgaertel, M. Witt, J. Baensch, M. Fabarius,A. Erko, F. Schaefers, H.
Schirmacher, Edited by: Shen, Q; Nelson, AIP Conference Proceedings
(2016), 1741, 040016
3. Alexander Firsov, Maria Brzhezinskaya, Heike Loechel, Frank Siewert,
Alexei Erko, The impact of novel 3D diffraction optics development,
Proc. of SPIE (2013), Vol. 8777 877713-1
4. Maria Brzhezinskaya, Alexander Firsov, Karsten Holldack, Torsten
Kachel, Rolf Mitzner, Niko Pontius, Christian Stamm, Jan-Simon Schmidt,
Alexander Föhlisch, Alexei Erko1 A Novel monochromator for ultrashort
soft X-ray pulses, Proc. of SPIE (2013), Vol. 8777 87771J-1
5. Christiane Becker, Jolly Xavier, Veit Preidel, Philippe Wyss, Tobias
Sontheimer, Bernd Rech, Jürgen Probst, Christoph Hülsen, Bernd Löchel,
Alexei Erko, Sven Burger, Frank Schmidt, Franziska Back, and Eveline
Rudigier-Voigt Nanophotonic light trapping in polycrystalline silicon
thin-film solar cells using periodically nanoimprint-structured glass
substrate, Proc. of SPIE (2013), Vol. 8824 88240D-1
6. A. Firsov, A. Erko, F. Senf, J. Rehanek, M. Brzhezinskaya, R.
Mitzner, Ph. Wernet, A, Föhlisch, Novel wavelength-dispersive X-ray
fluorescence spectrometer, J. Phys.: Conf. Ser. 425 152013
7. J. Rehanek, F. Schäfers, H. Löchel, A. Firsov, J. Grünert, W. Freund,
C. Ozkan, S. Molodtsov, A. Erko, A case study of novel X-ray Optics for
FEL sources Journal of Physics: Conference Series 425 (2013) 052013
8. H Löchel, M Brzhezinskaya, A Firsov, J Rehanek and A Erko, Reflection
zone plates for 2D focusing and spectroscopy of hard X-rays Journal of
Physics: Conference Series 425 (2013) 052025
9. B. Loechel, A. Erko, St. Lemke, B. Nelles, M. Schmidt, F. Senf
Installation of a technological center for highly efficient optical
gratings at Helmholtz-Zentrum Berlin (HZB), Journal of Physics:
Conference Series 425 (2013) 212012
10. A. Firsov, M. Brzhezinskay, A. Firsov, A. Svintsov, A. Erko,
Dedicated software for diffractive optics design and simulation Journal
of Physics: Conference Series 425 (2013) 162004
11. Cigdem Ozkan, Wolfgang Freund, Jens Rehanek, Jens Buck, Ivo Zizak,
Jan Gruenert, Franz Schaefers, Alexei Erko, Sergeui Molodtsov, Initial
Evaluation of the European XFEL Undulator Commissioning Spectrometer
with a Single Channel-Cut Crystal Proc. of SPIE (2012) Vol. 8504
85040X-1
12. J. Rehanek, F. Schäfers, A. Erko, M. Scheer, W. Freund, J. Grünert,
C. Ozkan, S. Molodtsov, Simulations of diagnostic spectrometers for the
European XFEL using the raytrace tool RAY, Proc. of SPIE (2011), Vol.
8141 814109-1
13. D. Korytár, C. Ferrari, P. Mikulík, P. Vagovič, E. Dobročka, V. Áč,
P. Konopka, A. Erko, N. Abrosimov, and Z. Zápražný 1D X-ray Beam
Compressing Monochromators, AIP Conference Proceedings 1221, 2010, 177
59-62
14. Erko A., A. Firsov, K. Holldack, New Developments in Femto-Second
Soft X-rays Spectroscopy, AIP Conference Proceedings 1234, 2010, 177-180
15. A. Shcherbinin; S. Dabagov; V. Mikhailin; W. Leitenberger; A. Erko
Synchrotron radiation focusing by polycapillary lens, Proc. SPIE Vol.
5943 X-ray and Neutron Capillary Optics II, Muradin A. Kumakhov; Richard
B. Hoover, Editors, 59430I, 2006
16. Alexei Erko, “μXRFA and μEXAFS Measurements of Organic and
Non-Organic Samples”, Proc. SPIE Vol. 6309, 63090W, Instruments,
Methods, and Missions for Astrobiology IX; Richard B. Hoover, Gilbert V.
Levin, Alexei Y. Rozanov; Eds. 2006
17. F. Pinakidou, M. Katsikini, E. C. Paloura, P. Kavouras, Ph.
Komninou, Th. Karakostas, A. Erko, Study of glasses containing Zn- and
Fe- contaminated Electric Arc Furnace Dust by means of μ-XRF mapping and
μ-XAFS, Proc. of the International Conference on Engineering for Waste
treatment, Albi, France, 2005.
18. Alexandre Firsov, Alexei I. Erko, Alexander Svintsov “Design and
fabrication of the diffractive x-ray optics at BESSY”, Design and
Microfabrication of Novel X-Ray Optics II; Anatoly A. Snigirev, Derrick
C. Mancini; Eds. Proc. SPIE Vol. 5539, (2004), p. 160-164
19. Alexei I. Erko, Alexandre Firsov, “Investigation of the properties
of Bragg-Fresnel gratings”, Design and Microfabrication of Novel X-Ray
Optics II; Anatoly A. Snigirev, Derrick C. Mancini; Eds. Proc. SPIE Vol.
5539, (2004), p. 148-159
20. Alexei Erko, Franz Schaefers, Nikolay Artemiev, “A ray-tracing code
for zone plates” Advances in Computational Methods for X-Ray and Neutron
Optics; Manuel Sanchez del Rio; Ed. Proc. SPIE Vol. 5536, (2004), p.
61-70,
21. Alexei I. Erko, Ingo Packe, Wolfgang Gudat, Nikolai V. Abrosimov,
Alexander A. Firsov “Graded crystal monochromator at Bessy II”, Advances
in X-Ray Optics; Andreas K. Freund, Tetsuya Ishikawa, Ali M. Khounsary,
Derrick C. Mancini, Alan G. Michette, Sebastian Oestreich; Eds. Proc.
SPIE Vol. 4145, p. 122-128 (2001)
22. Erko „Spatially Modulated Advanced X-Ray Optics“ Materials Science
Forum, 321-324 Trans Tech Publications, Switzerland, 2000, P. 174-178
23. Erko, I. Packe, C. Hellwig, M. Fieber-Erdmann, O. Pawlitzki, M.
Veldkamp, W. Gudat, KMC-2 : the new X-ray beamline at BESSY II,
Proceedings of the 11th US National Conference on Synchrotron Radiation
Instrumentation, SRI99, AIP Conference Proc. 521, 2000, P. 415-418
24. Vladimir A. Arkadiev, Alexander Baranov, Alexei I. Erko, Pavel E.
Kondrashov, Norbert Langhoff, Elena G. Novoselova, Igor S. Smirnov,
Markus Veldkamp, Ingo Packe “Carbon/carbon multilayers for synchrotron
radiation”, X-Ray Optics Design, Performance, and Applications; Ali M.
Khounsary, Andreas K. Freund, Tetsuya Ishikawa, George Srajer, Jonathan
C. Lang; Eds. Proc. SPIE Vol. 3773, p. 122-127 (1999)
25. M. Veldkamp, A. Erko, F. Schäfers, W. Gudat, N. Abrosimov, V. Alex,
S. Rossolenko, V. Shekhtman, E. Shulakov, S. Khasanov, I. Smirnova,
“Examination of Si1-xGex laterally graded crystals for use in high
brilliance synchrotron beams”, Proceedings of the 5th International
Symposium on Functionally Graded Materials (FGM ’98), Materials Science
Forum, 308-311, Trans Tech Publications, 1999, P. 597-602
26. Alexei Souvorov, Nikolai V. Abrosimov, Michael Drakopoulos, Alexei
I. Erko, Wolfgang Gudat, Andreas K. Freund, S. Rassolenko, W. Schroeder,
Irina Snigireva, Anatoly A. Snigirev, “New fixed-exit double-crystal
monochromator with one cooled crystal”, High Heat Flux and Synchrotron
Radiation Beamlines; Albert T. Macrander, Ali M. Khounsary; Eds. Proc.
SPIE Vol. 3151, p. 338-341, (1997)
27. Veldkamp, A. Erko, W. Gudat, N. V. Abrosimov, V. Alex, Scanning
x-ray method for measurements on Si1-xGex-crystals, Proceedings of the
7th International Conference on Defect Recognition and Image Processing
in Semiconductors (DRIP VII), Institute of Physics Conference Series,
Nr.160, IOP Publishing, 1997, P. 195-198
28. Alexei I. Erko, Franz Schaefers, Wolfgang Gudat, K. J. Sawhney,
Nikolai V. Abrosimov, S. N. Rossolenko, V. Alex, S. Groth, W. Schroeder,
Laterally graded Si1-xGex crystals for high-resolution synchrotron
x-ray optics, Optics for High-Brightness Synchrotron Radiation Beamlines
II; Lonny E. Berman, John Arthur; Eds. Proc. SPIE Vol. 2856, p. 110-119
(1996)
29. Alexei I. Erko, Franz Shaefers, Bernard Vidal, Andrey E. Yakshin,
Pierre Chevallier, “X-ray supermirrors for BESSY-II”, X-Ray Microbeam
Technology and Applications; Wenbing Yun; Ed. Proc. SPIE Vol. 2516, p.
206-209 (1995)
30. Karsten Holldack, Alexei I. Erko, William B. Peatman, “BESSY
Bragg-Fresnel multilayer beam monitor”, X-Ray Microbeam Technology and
Applications; Wenbing Yun; Ed. Proc. SPIE Vol. 2516, p. 210-216, (1995)
31. Alexei I. Erko, Alexander A. Firsov, Andrey E. Yakshin, Pierre
Chevallier, Pierre Dhez, “New generation of multilayer Bragg-Fresnel
lenses”, X-Ray Microbeam Technology and Applications; Wenbing Yun; Ed.
Proc. SPIE Vol. 2516, p. 38-40, (1995)
32. Anatoly Y. Faenov, Yu A. Agafonov, B. A. Bryunetkin, Alexei I. Erko,
G. V. Ivanenkov, A. R. Mingaleev, Sergey A. Pikuz, Vera M. Romanova,
Tatyana A. Shelkovenko, Igor Y. Skobelev “High-performance x-ray
spectroscopy of plasma microsources”, Applications of Laser Plasma
Radiation; Martin C. Richardson; Ed. Proc. SPIE Vol. 2015, p. 64-75
(1994)
33. Erko „Bragg-Fresnel Multilayer Optics for Microscopy and
Spectroscopy“, in Proc. of the 4-th International Conference on X-Ray
Microscopy, ed. V.V. Aristov, A.I. Erko, 1994, “Bogorodsky Pechatnik”,P.
601-610
34. F. Legrand, A. Erko, P. Dhez, P. Chevallier, C. Legrand „LURE – IMT
X-Ray Fluorescence microprobe: Resolution and performances“, in Proc. of
the 4-th International Conference on X-Ray Microscopy, ed. V.V.
Aristov, A.I. Erko, 1994, “Bogorodsky Pechatnik”, P. 136-141
35. Youry A. Agafonov, Sergey V. Babin, Alexei I. Erko, Alexander A.
Shestakov, Igor A. Schelokov “Fabrication of diffractive optical
elements for x-ray range”, Miniature and Micro-Optics and
Micromechanics; Neal C. Gallagher, Jr., Chandrasekhar Roychoudhuri; Eds.
Proc. SPIE Vol. 1992, p. 299-306 (1993)
36. S.V. Babin, A.I. Erko, „Electron Beam Lithography of Optical
Elements for X-Ray Range“, Proc. of the International conference on
Microlithography, San-Diego, Proc. SPIE Vol. 1671, P. 215-221 (1992)
37. Erko, P. Chevallier, P. Dhez, F. Legrand, B. Vidal, Scanning X-Ray
Microprobe with Multilayer Bragg-Fresnel Lens“ Inst. Phys. Conf. Ser.
130 „Proc. of the XIII International Conference on X-Ray Optics and
Microanalysis“ IOP Publishing, 1992, p.617-618
38. P. Chevallier, P. Dhez, A. Erko, E. Khzmalian, C. Khan-Malek, A.
Freund, L. Panchenko, S. Redkin, V. Zinenko, B. Vidal, „First test of
the Bragg–Fresnel Multilayer X-Ray Fluorescence Microscope at LURE“ in
X-Ray Microscopy III, Proceed. of the 3-d International Conference on
X-Ray Microscopy XRM-90 ed. by A.G. Michette, G.R. Morrison, Springer,
1992, P.391-398.
39. V.V. Aristov, A.I. Erko, A.A. Firsov, S.V. Gaponov, N.N.
Salashchenko, A.V. Zabelin, B.V. Rybakov, E.P. Stepanov, „Focusing of
Soft X-Ray Radiation by an Ellipsoidal Bragg-Fresnel Lenz“, Conference
Proceedings, 25-1, „2nd European Conference in X-Ray Synchrotron
Radiation Research“, A.Balena, E.Bernieri, S.Mobilio (Eds.) SIF,
Bolongna 1990, p.275-278.
40. V.V. Aristoiv, A.I .Erko, E.R. Khzmalian, “Silicon-Based Phase Zone
Plate for X- Rays”. Conference Proceedings, 25-1, „2nd European
Conference in X-Ray Synchrotron Radiation Research“ A.Balena,
E.Bernieri, S.Mobilio (Eds.) SIF, Bolongna, 1990, P.273-275.
41. S.V. Babin, A.I. Erko, A.A. Svintsov, “E-Beam Lithography of
non-periodical structures”, Proceedings of International Conference of
E-Beam Technology, Varna, Bulgaria, 1988, P.379-385.
42. V.V. Aristov, A.I. Erko, L.A. Panchenko, V.V. Martynov, S.V. Redkin ,
G.D. Sazonova „Zone Plates for the Nanometer Wavelength Range“, Spriger
Series in Optical Science 56 X-Ray Microscopy II Ed. by D.Sayre,
M.Howells, J.Kirz, H.Rarback, 1987, P.138-141.
43. V.V. Aristov, A.I. Erko, V.V. Martynov „X-Ray Fourier Optics“, AIP
Conference Proceedings, Nr.147, „Short Wavelength Coherent Radiation:
Generation and Application“, ed. by D.Attwood, J.Bocor, 1986, P.71-80.
44. V.V. Aristov, V.A. Agafonova, A.I. Erko, D.V. Roschupkin,
“Investigation of Proximity Effect Influence on Resist Properties”,
Proceedings of International Conference of E-Beam Technology, Varna,
Bulgaria, 1985, P.501-504.
45. V.V. Aristov, A.I. Erko, S.V. Babin, L.V. Dorozhkina, “Investigation
of Proximity Effect in E-Beam Lithography”, Proceedings of
International Conference on Microlithography, Cambridge, 1983, P.56-63.
46. V.V. Aristov, A.I. Erko, Ch.V. Kopetski, “Prospects for the
Applications of Methods of Diffraction Optics to X-Ray Lithography”,
Proceedings International Conference on Microlithography, Grenoble,
1982, P.137-141.
47. A.I. Erko, V.V. Aristov, “Perspectives of microscopy and holography
in soft X-rays”, in ”Physical principles of holography”, Proceeding of
the XIII School in Holography, Leningrad, 1981, P. 181-208. (in Russian)
48. A.I. Erko A.N. Malov, “Hologram recording on a dichromate gelatin
layer with latent image control”, Quantum Electronics, Proceedings of
Leningrad Polytechnic Institute, Nr. 366, Leningrad, 1979, P. 107-110
(in Russian)
References: Books
- Рентгеновская Оптика, В.В. Аристов, А.И. Ерко, Наука, Москва, 1991, 120 стр
- X-Ray Microscopy IV, Proc. of the 4-th International Conference on X-Ray Microscopy, Chernogolovka, Russia, 1994 eds. V.V. Aristov , A.I. Erko „Bogorodsky Pechatnik“ 1995
- Diffraction X-Ray Optics, A.I. Erko V.V.Aristov, B.Vidal, „“ IOP Publishing, Bristol, 1996, 150 P.
- X-Ray Optics, in “Handbook of Practical X-Ray Fluorescence Analysis” eds. B. Beckhoff et al., Springer, 2006, 85-190
- Modern Developments in X-Ray and Neutron Optics, Eds. A. Erko, M. Idir, Th. Krist, A. G. Michette, Springer, 2008